Alexander Scharinger was born in 1982 in Grieskirchen, Austria. He received a Bachelor’s degree in Software & Information Engineering and a Master’s degree in Logic and Computation from TU Wien in 2015 and 2018, respectively. He joined the Institute for Microelectronics in April 2019, where he is currently working on his doctoral degree within the scope of the Christian Doppler Laboratory for High Performance TCAD. His research interests include efficient algorithms and data structures for surface rate calculations, in particular ray tracing and stochastic sampling methods, for Process TCAD.
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