H. Kirchauer and S. Selberherr: Three-Dimensional Photolithography Simulation

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Three-Dimensional Photolithography Simulation

Heinrich Kirchauer and Siegfried Selberherr
Institute for Microelectronics, TU Vienna, Gußhausstraße 27-29, A-1040 Vienna, Austria
Phone: +43/1/58801-3750, FAX: +43/1/5059224
E-mail: kirchauer@iue.tuwien.ac.at, WWW: http://www.iue.tuwien.ac.at



Abstract. - An overall three-dimensional photolithography simulator is presented, which has been developed for workstation based application. The simulator consists of three modules according to the fundamental processes of photolithography, namely imaging, exposure/bleaching and development. General illumination forms are taken into account. The nonlinear bleaching reaction of the photoresist is considered and electromagnetic light-scattering due to a nonplanar topography is treated by solving repeatedly the Maxwell equations within an inhomogeneous medium. A novel extension of the two-dimensional differential method into the third dimension is presented and a numerically efficient implementation for exposure simulation under partial coherent illumination is described. The development process is simulated with a cellular based surface advancement algorithm.


Figure 1: Aerial image of a photomask carrying the pattern logo.gif.




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H. Kirchauer and S. Selberherr: Three-Dimensional Photolithography Simulation