Gerhard Rzepa

Tel.Nr.: +43 1 58801-36030

Room.Nr.: CD 05 48

 Has been working for the IµE since 01-12-2013.

Gerhard Rzepa received the BSc degree in Electrical Engineering in 2010 and the Diplomingenieur degree in Microelectronics in 2013, both from the TU Wien (Vienna University of Technology). Since 2013 he is working on his doctoral degree at the Institute for Microelectronics, TU Wien. His main research interests are oxide degradation, device variability and measuring and modeling of related reliability phenomena such as bias temperature instabilities, hot carrier degradation, random telegraph noise, and stress induced leakage currents.