Roberto Lacerda de Orio was born in Sao Paulo, Brazil, in 1981. He studied electrical engineering at the State University of Campinas, where he received a master's degree in 2006. He joined the Institute for Microelectronics in October 2006, where he received his doctoral degree in 2010 and where he is currently employed as a post-doctoral researcher. His main scientific interests include modeling and simulation of electromigration and stress-induced phenomena on interconnects.