Franz Schanovsky was born in Linz, Austria, in 1981. He studied electrical engineering at the Technische Universität Wien, where he received the degree of
Diplomingenieur and the PhD in technical sciences in 2008 and 2013, respectively. He joined the Institute for Microelectronics in December 2006, where he is presently working as a post-doctoral researcher. His scientific interests include atomistic modeling of point-defects and the quantum-mechanical aspects of semiconductor device simulation.