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Publication list for
Johann Cervenka
as author or essentially involved person

65 records


Publications in Scientific Journals


14. Yu. Illarionov, M. I. Vexler, M. Karner, S. E. Tyaginov, J. Cervenka, T. Grasser:
"TCAD Simulation of Tunneling Leakage Current in CaF2/Si(111) MIS Structures";
Current Applied Physics, 15, (2015), 78 - 83 doi:10.1016/j.cap.2014.10.015.

13. S. E. Tyaginov, Yu. Illarionov, M. I. Vexler, M. Bina, J. Cervenka, J. Franco, B. Kaczer, T. Grasser:
"Modeling of deep-submicron silicon-based MISFETs with calcium fluoride dielectric";
Journal of Computational Electronics, 1, (2014), 1 - 6 doi:10.1007/s10825-014-0593-9.

12. M. Vasicek, J. Cervenka, D. Esseni, P. Palestri, T. Grasser:
"Applicability of Macroscopic Transport Models to Decananometer MOSFETs";
IEEE Transactions on Electron Devices, 59, (2012), 639 - 646 doi:10.1109/TED.2011.2181177.

11. J. Cervenka, H. Kosina, S. Selberherr, J. Zhang, N. Hrauda, J. Stangl, G. Bauer, G. Vastola, A. Marzegalli, F. Montalenti, L. Miglio:
"Strained MOSFETs on Ordered SiGe Dots";
Solid-State Electronics, 65-66, (2011), 81 - 87 doi:10.1016/j.sse.2011.06.041.

10. I. Starkov, S. E. Tyaginov, H. Enichlmair, J. Cervenka, C. Jungemann, S. Carniello, J.M. Park, H. Ceric, T. Grasser:
"Hot-Carrier Degradation Caused Interface State Profile-Simulation versus Experiment";
Journal of Vacuum Science & Technology B, 29, (2011), 01AB09-1 - 01AB09-8 doi:10.1116/1.3534021.

9. S. E. Tyaginov, I. Starkov, O. Triebl, J. Cervenka, C. Jungemann, S. Carniello, J.M. Park, H. Enichlmair, M. Karner, C. Kernstock, E. Seebacher, R. Minixhofer, H. Ceric, T. Grasser:
"Interface Traps Density-of-States as a Vital Component for Hot-Carrier Degradation Modeling";
Microelectronics Reliability, 50, (2010), 1267 - 1272 doi:10.1016/j.microrel.2010.0.

8. H. Ceric, R. Orio, J. Cervenka, S. Selberherr:
"A Comprehensive TCAD Approach for Assessing Electromigration Reliability of Modern Interconnects";
IEEE Transactions on Device and Materials Reliability, 9, (2009), 9 - 19 doi:10.1109/TDMR.2008.2000893.

7. J. Cervenka, H. Ceric, S. Selberherr:
"Three-Dimensional Simulation of Sacrificial Etching";
Microsystem Technologies - Micro- and Nanosystems - Information Storage and Processing Systems, 14, (2008), 665 - 671 doi:10.1007/s00542-007-0491-1.

6. M. Vasicek, J. Cervenka, M. Wagner, M. Karner, T. Grasser:
"A 2D Non-Parabolic Six-Moments Model";
Solid-State Electronics, 52, (2008), 1606 - 1609 doi:10.1016/j.sse.2008.06.010.

5. M. Vasicek, J. Cervenka, M. Wagner, M. Karner, T. Grasser:
"Parameter Modeling for Higher-Order Transport Models in UTB SOI MOSFETs";
Journal of Computational Electronics, 7, (2008), 168 - 173 doi:10.1007/s10825-008-0239-x.

4. M. Wagner, M. Karner, J. Cervenka, M. Vasicek, H. Kosina, S. Holzer, T. Grasser:
"Quantum Correction for DG MOSFETs";
Journal of Computational Electronics, 5, (2007), 397 - 400 doi:10.1007/s10825-006-0032-7.

3. J. Cervenka, W. Wessner, E. Al-Ani, T. Grasser, S. Selberherr:
"Generation of Unstructured Meshes for Process and Device Simulation by Means of Partial Differential Equations";
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, 25, (2006), 2118 - 2128 doi:10.1109/TCAD.2006.876514.

2. W. Wessner, J. Cervenka, C. Heitzinger, A. Hössinger, S. Selberherr:
"Anisotropic Mesh Refinement for the Simulation of Three-Dimensional Semiconductor Manufacturing Processes";
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, 25, (2006), 2129 - 2139 doi:10.1109/TCAD.2005.862750.

1. J. Cervenka, R. Klima, M. Knaipp, S. Selberherr:
"Three-Dimensional Device Optimization by Green's Functions";
European Physical Journal - Applied Physics, 21, (2003), 103 - 106 doi:10.1051/epjap:2002121.


Contributions to Books


5. J. Cervenka, P. Ellinghaus, M. Nedjalkov:
"Deterministic Solution of the Discrete Wigner Equation";
in "Numerical Methods and Applications", I. Dimov, S. Fidanova, I. Lirkov (ed); Springer International Publishing, 2015, ISBN: 978-3-319-15584-5, 149 - 156 doi:10.1007/978-3-319-15585-2_17.

4. J. Cervenka, P. Ellinghaus, M. Nedjalkov, E. Langer:
"Optimization of the Deterministic Solution of the Discrete Wigner Equation";
in "Lecture Notes in Computer Science", 9374, I. Lirkov, S. Margenov, J. Wasniewski (ed); Springer, 2015, ISBN: 978-3-319-26519-3, 269 - 276 doi:10.1007/978-3-319-26520-9_29.

3. J. Cervenka, A. Zoric, T. Gurov, G. Arsov:
"GRINKO - Grid e-Infrastructure and Networking with Kosovo";
in "JOINT RESEARCH AND TECHNOLOGY DEVELOPMENT Projects 2007-2010", KAIP, 2010, 150 - 162.

2. M. Vasicek, V. Sverdlov, J. Cervenka, T. Grasser, H. Kosina, S. Selberherr:
"Transport in Nanostructures: A Comparative Analysis Using Monte Carlo Simulation, the Spherical Harmonic Method, and Higher Moments Models";
in "Lecture Notes in Computer Science, Vol. 5910", I. Lirkov, S. Margenov, J. Wasniewski (ed); Springer, 2010, ISSN: 0302-9743, 443 - 450 doi:10.1007/978-3-642-12535-5_52.

1. R. Wittmann, S. Uppal, A. Hössinger, J. Cervenka, S. Selberherr:
"A Study of Boron Implantation into High Ge Content SiGe Alloys";
in "SiGe and Ge: Materials, Processing, and Devices, Vol. 3, No. 7", issued by The Electrochemical Society; D. Harame, J. Boquet, M. Caymax, J. Cressler, H. Iwai, S. Koester, G. Masini, J. Murota, A. Reznicek, K. Rim, B. Tillack, S. Zaima (ed); ECS Transactions, 2006, ISBN: 1-56677-507-8, 667 - 676 doi:10.1149/1.2355862.


Talks and Poster Presentations (with Proceedings-Entry)


38. J. Cervenka, L. Filipovic:
"Numerical Aspects of the Deterministic Solution of the Wigner Equation";
Poster: International Wigner Workshop (IW2), Low Wood Bay, Lake District, UK; 2017-06-05 in "Book of Abstracts of the 2nd International Wigner Workshop (IW2)", (2017), ISBN: 978-3-200-05129-4, 42 - 43.

37. J. Cervenka, P. Ellinghaus:
"Preconditioned Deterministic Solver for the Wigner Equation";
Talk: International Conference on Large-Scale Scientific Computations (LSSC), Sozopol, Bulgaria; 2015-06-08 - 2015-06-12; in "Abstracts International Conference on Large-Scale Scientific Computations (LSSC)", (2015), 31.

36. J. Cervenka, P. Ellinghaus, M. Nedjalkov:
"Deterministic Solution of the Discrete Wigner Equation";
Talk: International Conference on Numerical Methods and Applications, Borovets, Bulgaria; 2014-08-20 - 2014-08-24; in "Eighth International Conference on Numerical Methods and Applications", (2014), 36.

35. J. Cervenka, A. Steinmair, J.M. Park, E. Seebacher, T. Grasser:
"TCAD Simulations of Statistical Process Variations for High-Voltage LDMOS Transistors";
Talk: European Workshop on CMOS Variability, Nice, France; 2012-06-11 - 2012-06-12; in "Proceedings of the 3rd European Workshop on CMOS Variability", (2012), ISBN: 978-2-914561-56-3, 4 page(s) .

34. J. Weinbub, J. Cervenka, K. Rupp, S. Selberherr:
"High-Quality Mesh Generation Based on Orthogonal Software Modules";
Poster: International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), Osaka, Japan; 2011-09-08 - 2011-09-10; in "Proceedings of the 16th International Conference on Simulation of Semiconductor Processes and Devices (SISPAD)", (2011), ISBN: 978-1-61284-418-3, 139 - 142 doi:10.1109/SISPAD.2011.6035078.

33. J. Weinbub, J. Cervenka, K. Rupp, S. Selberherr:
"A Generic High-Quality Meshing Framework";
Talk: Symposium on Trends in Unstructured Mesh Generation (Meshtrends), Minneapolis, USA; 2011-07-25 - 2011-07-28; in "Proceedings of the 11th US National Congress on Computational Mechanics (USNCCM)", (2011), 1 page(s) .

32. L. Filipovic, H. Ceric, J. Cervenka, S. Selberherr:
"A Simulator for Local Anodic Oxidation of Silicon Surfaces";
Talk: IEEE Canadian Conference on Electrical and Computer Engineering (CCECE), Niagara Falls, Canada; 2011-05-08 - 2011-05-11; in "Proceedings of the 24th Canadian Conference on Electrical and Computer Engineering (CCECE 2011)", (2011), ISBN: 978-1-4244-9789-8, 695 - 698 doi:10.1109/CCECE.2011.6030543.

31. S. E. Tyaginov, I. Starkov, O. Triebl, J. Cervenka, C. Jungemann, S. Carniello, J.M. Park, H. Enichlmair, M. Karner, C. Kernstock, E. Seebacher, R. Minixhofer, H. Ceric, T. Grasser:
"Interface Traps Density-of-States as a Vital Component for Hot-Carrier Degradation Modeling";
Talk: European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (ESREF), Montecassino Abbey and Gaeta; 2010-10-11 - 2010-10-15; in "Proceedings of the 21st European Symposium on the Reliability of Electron Devices, Failure Physics and Analysis", (2010), 3 page(s) .

30. J. Cervenka, H. Kosina, S. Selberherr, J. Zhang, N. Hrauda, J. Stangl, G. Bauer, G. Vastola, A. Marzegalli, L. Miglio:
"Strained MOSFETs on Ordered SiGe Dots";
Talk: European Solid-State Device Research Conference (ESSDERC), Sevilla; 2010-09-14 - 2010-09-16; in "Proceedings of the 40th European Solid-State Device Research Conference (ESSDERC)", (2010), ISBN: 978-1-4244-6660-3, 297 - 300.

29. I. Starkov, S. E. Tyaginov, O. Triebl, J. Cervenka, C. Jungemann, S. Carniello, J.M. Park, H. Enichlmair, M. Karner, C. Kernstock, E. Seebacher, R. Minixhofer, H. Ceric, T. Grasser:
"Analysis of Worst-Case Hot-Carrier Conditions for High Voltage Transistors Based on Full-Band Monte-Carlo Simulations";
Poster: International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA), Singapore; 2010-07-05 - 2010-07-09; in "Proceedings of the 17th International Symposium on the Physical & Failure Analysis of Integrated Circuits", (2010), ISBN: 978-1-4244-5595-9, 139 - 144.

28. S. E. Tyaginov, I. Starkov, O. Triebl, J. Cervenka, C. Jungemann, S. Carniello, J.M. Park, H. Enichlmair, M. Karner, C. Kernstock, E. Seebacher, R. Minixhofer, H. Ceric, T. Grasser:
"Hot-Carrier Degradation Modeling Using Full-Band Monte-Carlo Simulations";
Talk: International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA), Singapore; 2010-07-05 - 2010-07-09; in "Proceedings of the 17th International Symposium on the Physical & Failure Analysis of Integrated Circuits", (2010), ISBN: 978-1-4244-5595-9, 341 - 345.

27. I. Starkov, S. E. Tyaginov, H. Enichlmair, O. Triebl, J. Cervenka, C. Jungemann, S. Carniello, J.M. Park, H. Ceric, T. Grasser:
"HC Degradation Model: Interface State Profile-Simulations vs. Experiment";
Poster: Workshop on Dielectrics in Microelectronics (WODIM), Bratislava; 2010-06-28 - 2010-06-30; in "Book of Abstracts", (2010), 128.

26. R. Orio, H. Ceric, J. Cervenka, S. Selberherr:
"Electromigration Failure Development in Modern Dual-Damascene Interconnects";
Talk: International Conference on Very Large Scale Integration (VLSI-SoC), Florianopolis; 2009-10-12 - 2009-10-14; in "Proceedings of the International Conference on Very Large Scale Integration (VLSI-SoC)", (2009), Vol.15, ISBN: 978-3-90188-237-1, 5 page(s) .

25. H. Ceric, R. Orio, J. Cervenka, S. Selberherr:
"Copper Microstructure Impact on Evolution of Electromigration Induced Voids";
Talk: International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), San Diego, CA, USA; 2009-09-09 - 2009-09-11; in "Proceedings of the 14th International Conference on Simulation of Semiconductor Processes and Devices (SISPAD)", (2009), ISBN: 978-1-4244-3947-8, 178 - 181 doi:10.1109/SISPAD.2009.5290222.

24. R. Orio, H. Ceric, J. Cervenka, S. Selberherr:
"The Effect of Copper Grain Size Statistics on the Electromigration Lifetime Distribution";
Talk: International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), San Diego, CA, USA; 2009-09-09 - 2009-09-11; in "Proceedings of the 14th International Conference on Simulation of Semiconductor Processes and Devices (SISPAD)", (2009), ISBN: 978-1-4244-3947-8, 182 - 185 doi:10.1109/SISPAD.2009.5290219.

23. R. Orio, H. Ceric, J. Cervenka, S. Selberherr:
"The Effect of Microstructure on Electromigration-Induced Failure Development";
Talk: Intl. Symposium on Microelectronics Technology and Devices (SBMicro), Natal; 2009-08-31 - 2009-09-03; in "ECS Transactions", (2009), ISBN: 978-1-56677-737-7, 345 - 352.

22. H. Ceric, R. Orio, J. Cervenka, S. Selberherr:
"The Effect of Microstructure on Electromigration Induced Voids";
Talk: International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA), Suzhou; 2009-07-06 - 2009-07-10; in "Proceedings of the International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA)", (2009), ISBN: 9781-4244-3912-6, 694 - 697.

21. R. Orio, H. Ceric, J. Cervenka, S. Selberherr:
"The Effect of Microstructure on the Electromigration Lifetime Distribution";
Talk: International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA), Suzhou; 2009-07-06 - 2009-07-10; in "Proceedings of the International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA2009)", (2009), 731 - 734.

20. P. Schwaha, J. Cervenka, M. Nedjalkov, T. Gurov, G. Arsov, A. Misev, A. Zoric, S. Ilic:
"Computational Electronics on GRID: A Mixed Mode Carrier Transport Model";
Talk: International Conference On Applications Of Mathematics In Technical And Natural Sciences, Sozopol (Bulgaria); 2009-06-22 - 2009-06-27; in "1st International Conference On Applications Of Mathematics In Technical And Natural Sciences", (2009), Vol.1186, ISBN: 978-0-7354-0752-7, 206 - 214 doi:10.1063/1.3265331.

19. V. Sverdlov, M. Vasicek, J. Cervenka, T. Grasser, H. Kosina, S. Selberherr:
"Transport in Nanostructures: A Comparative Analysis Using Monte Carlo Simulation, the Spherical Harmonic Method, and Higher Moments Models";
Talk: International Conference on Large-Scale Scientific Computations (LSSC), Sozopol; 2009-06-04 - 2009-06-08; in "Abstracts of the International Conference on Large-Scale Scientific Computations (LSSC)", (2009), 93.

18. H. Ceric, R. Orio, J. Cervenka, S. Selberherr:
"Stress-Induced Anisotropy of Electromigration in Copper Interconnects";
Talk: International Workshop on Stress-Induced Phenomena in Metallization, Austin; 2008-11-05 - 2008-11-07; in "Proceedings of the Stress-Induced Phenomena in Metallization: 10th International Workshop", (2008), ISBN: 978-0-7354-0680-3, 56 - 62.

17. H. Ceric, R. Orio, J. Cervenka, S. Selberherr:
"Analysis of Microstructure Impact on Electromigration";
Poster: International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), Hakone, Japan; 2008-09-09 - 2008-09-11; in "Proceedings of the 13th International Conference on Simulation of Semiconductor Processes and Devices (SISPAD)", (2008), ISBN: 978-1-4244-1753-7, 241 - 244 doi:10.1109/SISPAD.2008.4648282.

16. M. Vasicek, J. Cervenka, M. Karner, T. Grasser:
"Consistent Higher-Order Transport Models for SOI MOSFETs";
Poster: International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), Hakone, Japan; 2008-09-09 - 2008-09-11; in "Proceedings of the 13th International Conference on Simulation of Semiconductor Processes and Devices (SISPAD)", (2008), ISBN: 978-1-4244-1753-7, 129 - 132 doi:10.1109/SISPAD.2008.4648254.

15. H. Ceric, R. Orio, J. Cervenka, S. Selberherr:
"TCAD Solutions for Submicron Copper Interconnect";
Talk: International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA), Singapore; 2008-07-07 - 2008-07-11; in "Proceedings 15th International Symposium on the Physical and Failure Analysis of Integrated Circuits", (2008), ISBN: 978-1-4244-2039-1, 78 - 81.

14. M. Vasicek, J. Cervenka, M. Wagner, M. Karner, T. Grasser:
"A 2D-Non-Parabolic Six Moments Model";
Talk: International Semiconductor Device Research Symposium (ISDRS), Maryland; 2007-12-12 - 2007-12-14; in "2007 International Semiconductor Device Research Symposium", (2007), ISBN: 978-1-4244-1892-3, 2 page(s) .

13. M. Vasicek, J. Cervenka, M. Karner, M. Wagner, T. Grasser:
"Parameter Modeling for Higher-Order Transport Models in UTB SOI MOSFETs";
Poster: International Workshop on Computational Electronics (IWCE), Amherst, MA, USA; 2007-10-08 - 2007-10-10; in "Book of Abstracts of the 12th International Workshop on Computational Electronics (IWCE)", (2007), 96 - 97.

12. J. Cervenka, H. Ceric, O. Ertl, S. Selberherr:
"Three-Dimensional Sacrificial Etching";
Poster: T. Grasser, S. Selberherr (ed); International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), Vienna, Austria; 2007-09-25 - 2007-09-27; in "Proceedings of the 12th International Conference on Simulation of Semiconductor Processes and Devices (SISPAD)", (2007), Vol.12, ISBN: 978-3-211-72860-4, 433 - 436 doi:10.1007/978-3-211-72861-1_105.

11. J. Cervenka, H. Ceric, S. Selberherr:
"Three-Dimensional Simulation of Sacrificial Etching";
Talk: Proceedings of SPIE - The International Society for Optical Engineering, Masapalomas; 2007-05-02 - 2007-05-04; in "Proceedings of SPIE", (2007), Vol.6589-6593, ISBN: 978-0-8194-6726-3, 65891L.1 - 65891L.9.

10. R. Wittmann, S. Uppal, A. Hössinger, J. Cervenka, S. Selberherr:
"A Study of Boron Implantation into High Ge Content SiGe Alloys";
Talk: Meeting of the Electrochemical Society, SiGe and Germanium: Materials, Processing, and Devices, Cancun; 2006-10-29 - 2006-11-03; in "210th ECS Meeting", (2006), ISSN: 1091-8213, 1 page(s) .

9. A. Nentchev, J. Cervenka, G. Marnaus, H. Enichlmair, S. Selberherr:
"Heatring - Smart Investigation of Temperature Impact on Integrated Circuit Devices";
Talk: Workshop on Thermal Investigations of ICs and Systems (THERMINIC), Nice; 2006-09-27 - 2006-09-29; in "Collection of Papers Presented at the 12th International Workshop on Thermal Investigation of ICs and Systems", (2006), ISBN: 2-9161-8704-9, 235 - 238.

8. R. Wittmann, A. Hössinger, J. Cervenka, S. Uppal, S. Selberherr:
"Monte Carlo Simulation of Boron Implantation into (100) Germanium";
Talk: International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), Monterey, CA, USA; 2006-09-06 - 2006-09-08; in "Proceedings of the 11th International Conference on Simulation of Semiconductor Processes and Devices (SISPAD)", (2006), ISBN: 1-4244-0404-5, 381 - 384 doi:10.1109/SISPAD.2006.282914.

7. H. Ceric, J. Cervenka, E. Langer, S. Selberherr:
"Moving Boundary Applications in Process and Interconnect TCAD";
Talk: Mini-Workshop on Anisotropic Motion Laws, Oberwolfach; 2006-08-13 - 2006-08-19; in "Proceedings Mini-Workshop on Anisotropic Motion Laws", (2006), Vol.Report No.38/2006, 13 - 16.

6. W. Wessner, H. Ceric, J. Cervenka, S. Selberherr:
"Dynamic Mesh Adaptation for Three-Dimensional Electromigration Simulation";
Talk: International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), Tokyo, Japan; 2005-09-01 - 2005-09-03; in "Proceedings of the 10th International Conference on Simulation of Semiconductor Processes and Devices (SISPAD)", (2005), ISBN: 4-9902762-0-5, 147 - 150 doi:10.1109/SISPAD.2005.201494.

5. J. Cervenka, A. Hössinger, R. Minixhofer, T. Grasser, S. Selberherr:
"Dreidimensionale Modellierung Elektronischer Bauteile";
Poster: Informationstagung Mikroelektronik (ME), Wien; 2003-10-01 - 2003-10-02; in "Beiträge der Informationstagung Mikroelektronik 2003", (2003), ISBN: 3-85133-030-7, 377 - 382.

4. A. Hössinger, J. Cervenka, S. Selberherr:
"A Multistage Smoothing Algorithm for Coupling Cellular and Polygonal Datastructures";
Poster: International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), Cambridge, MA, USA; 2003-09-03 - 2003-09-05; in "Proceedings of the 8th International Conference on Simulation of Semiconductor Processes and Devices (SISPAD)", (2003), ISBN: 0-7803-7826-1, 259 - 262 doi:10.1109/SISPAD.2003.1233686.

3. V. Palankovski, G. Röhrer, E. Wachmann, J. Kraft, B. Löffler, J. Cervenka, R. Quay, T. Grasser, S. Selberherr:
"Optimization of High-Speed SiGe HBTs";
Talk: International Symposium on Electron Devices for Microwave and Optoelectronic Applications (EDMO), Wien; 2001-11-15 - 2001-11-16; in "Proceedings Intl. Symposium on Electron Devices for Microwave and Optoelectronic Applications", (2001), ISBN: 0-7803-7049-x, 187 - 191 doi:10.1109/EDMO.2001.974305.

2. J. Cervenka, P. Fleischmann, S. Selberherr, M. Knaipp, F. Unterleitner:
"Optimization of Industrial High Voltage Structures by Three-Dimensional Diffusion Simulation";
Talk: European Solid-State Device Research Conference (ESSDERC), Nürnberg; 2001-09-11 - 2001-09-13; in "Proceedings of the 31st European Solid-State Device Research Conference", (2001), ISBN: 2-914601-01-8, 227 - 230.

1. J. Cervenka, M. Knaipp, A. Hössinger, S. Selberherr:
"Green's Function Approach for Three-Dimensional Diffusion Simulation of Industrial High Voltage Applications";
Poster: International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), Athens, Greece; 2001-09-05 - 2001-09-07; in "Proceedings of the 6th International Conference on Simulation of Semiconductor Processes and Devices (SISPAD)", (2001), ISBN: 3-211-83708-6, 408 - 411 doi:10.1007/978-3-7091-6244-6_94.


Talks and Poster Presentations (without Proceedings-Entry)


1. B. Ullmann, A. Grill, P. Manstetten, M. Jech, M. Kampl, W. H. Zisser, L. Filipovic, M. Thesberg, F. Rudolf, T. Windbacher, J. Cervenka, M. Katterbauer, J. Weinbub:
"Ihr Smartphone - ein Supercomputer vor 20 Jahren. Ein Einblick in die Mikro- und Nanoelektronik";
Talk: Lange Nacht der Forschung 2016, Wien; 2016-04-22.


Doctor's Theses (authored and supervised)


1. J. Cervenka:
"Three-Dimensional Mesh Generation for Device and Process Simulation";
Reviewer: T. Grasser, H. Haas; Institut für Mikroelektronik, 2004, oral examination: 2004-10-20.


Diploma and Master Theses (authored and supervised)


1. J. Cervenka:
"Generation of Geometry Conforming Triangular Grids";
Supervisor: S. Selberherr, E. Langer; Institut für Mikroelektronik, 1999, .


Scientific Reports


5. J. Lorenz, T. Clees, E. Bär, R. Jancke, U. Paschen, P. Lang, C. Salzig, B. Klaaßen, M. Hauser, J. Cervenka:
"Hierarchische Simulation nanoelektronischer Systeme zur Beherrschung von Prozessschwankungen";
(2011), 74 page(s) .

4. H. Kosina, J. Cervenka:
"MOdeling and DEsign of Reliable, process variation-aware Nanoelectronic devices, circuits and systems";
(2010), 24 page(s) .

3. J. Lorenz, T. Clees, E. Bär, R. Jancke, U. Paschen, P. Lang, C. Salzig, B. Klaaßen, M. Hauser, J. Cervenka:
"Hierarchische Simulation nanoelektronischer Systeme zur Beherrschung von Prozessschwankungen";
(2010), 79 page(s) .

2. J. Lorenz, T. Clees, E. Bär, R. Jancke, U. Paschen, P. Lang, C. Salzig, B. Klaaßen, M. Hauser, J. Cervenka:
"Hierarchische Simulation nanoelektronischer Systeme zur Beherrschung von Prozessschwankungen";
(2010), 100 page(s) .

1. T. Binder, J. Cervenka, A. Gehring, C. Harlander, C. Heitzinger, S. Selberherr:
"VISTA Status Report I";
(2001), 24 page(s) .