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Publication list for
Marco Rovitto
as author or essentially involved person

8 records


Talks and Poster Presentations (with Proceedings-Entry)


7. S. Papaleo, M. Rovitto, H. Ceric:
"Mechanical Effects of the Volmer-Weber Growth in the TSV Sidewall";
Talk: IEEE Electronic Components and Technology Conference (ECTC), Las Vegas, NV, USA; 2016-05-31 - 2016-06-03; in "Proceedings of IEEE Electronic Components and Technology Conference (ECTC)", (2016), ISBN: 978-1-5090-1204-6, 1617 - 1622 doi:10.1109/ECTC.2016.19.

6. M. Rovitto, H. Ceric:
"Electromigration Induced Voiding and Resistance Change in Three-Dimensional Copper Through Silicon Vias";
Talk: IEEE Electronic Components and Technology Conference (ECTC), Las Vegas, NV, USA; 2016-05-31 - 2016-06-03; in "Proceedings of IEEE Electronic Components and Technology Conference (ECTC)", (2016), ISBN: 978-1-5090-1204-6, 550 - 556 doi:10.1109/ECTC.2016.49.

5. H. Ceric, R. Lacerda de Orio, M. Rovitto:
"TCAD Approach for the Assessment of Interconnect Reliability";
Talk: International Conference Reliability and Stress-Related Phenomena in Nanoelectronics - Experiment and Simulation (IRSP), Bad Schandau, Germany; (invited) 2016-05-30 - 2016-06-01; in "Abstracts of 14th International Conference Reliability and Stress-Related Phenomena in Nanoelectronics - Experiment and Simulation (IRSP)", (2016), T21.

4. H. Ceric, M. Rovitto:
"Impact of Microstructure and Current Crowding on Electromigration: A TCAD Study";
Talk: International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), Washington DC, USA; 2015-09-09 - 2015-09-11; in "Proceedings of the 20th International Conference on Simulation of Semiconductor Processes and Devices (SISPAD)", (2015), ISBN: 978-1-4673-7858-1, 194 - 197 doi:10.1109/SISPAD.2015.7292292.

3. M. Rovitto, W. H. Zisser, H. Ceric:
"Analysis of Electromigration Void Nucleation Failure Time in Open Copper TSVs";
Poster: International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA), Hsinchu, Taiwan; 2015-06-29 - 2015-07-02; in "Proceedings of the IEEE 22nd International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA)", (2015), .

2. M. Rovitto, W. H. Zisser, H. Ceric, T. Grasser:
"Electromigration Modelling of Void Nucleation in Open Cu-TSVs";
Poster: International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (EuroSimE), Budapest, Hungary; 2015-04-19 - 2015-04-22; in "Proceedings of the IEEE 16th International Conference on Thermal, Mechanical & Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (EuroSimE)", (2015), ISBN: 978-1-4799-9949-1, 5 page(s) doi:10.1109/EuroSimE.2015.7103100.

1. H. Ceric, W. H. Zisser, M. Rovitto, S. Selberherr:
"Electromigration in Solder Bumps: A Mean-Time-to-Failure TCAD Study";
Poster: International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), Yokohama, Japan; 2014-09-09 - 2014-09-11; in "Proceedings of the 19th International Conference on Simulation of Semiconductor Processes and Devices (SISPAD)", (2014), ISBN: 978-1-4799-5285-4, 221 - 224 doi:10.1109/SISPAD.2014.6931603.


Doctor's Theses (authored and supervised)


1. M. Rovitto:
"Electromigration Reliability Issue in Interconnects for Three-Dimensional Integration Technologies";
Reviewer: H. Ceric, K. Weide-Zaage; E360, 2016, oral examination: 2016-12-13.