MSc. Konstantinos Tselios
Time:Wednesday February, 28th, 2024, 14:00
Place:CB 03 02 (Dean's office meeting room)
Title:Statistical Analysis of Reliability and Variability Effects in CMOS Technologies Based on Single-Defect Spectroscopy
Doctoral Dissertation Committee:
Committee Chair:
- Univ.-Prof.Dr. Ulrich Schmid (TU Wien, Austria)
Supervisor and Examiner:
- Assoc.Prof.Dr. Michael Waltl (TU Wien, Austria)
Examiner:
- Prof.Dr. Andrea Padovani (University of Modena and Reggio Emilia, Italy)
- Prof.Dr. Runsheng Wang (Peking University, China)