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application/pdfIEEEIEEE Transactions on Electron Devices;2018;65;11;10.1109/TED.2018.2870170Activation energy mapsbias temperature instability (BTI)modelingVoltage-Dependent Activation Energy Maps for Analytic Lifetime Modeling of NBTI Without Time ExtrapolationKatja PuschkarskyHans ReisingerChristian SchlunderWolfgang GustinTibor Grasser
IEEE Transactions on Electron Devices4764 Nov. 2018116510.1109/TED.2018.28701704771
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