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2018-06-13T04:09:58-04:00
Characterization of Single Defects in Ultrascaled MoS2 Field-Effect Transistors
10.1021/acsnano.8b00268
American Chemical Society
Bernhard Stampfer (ORCID: 0000-0001-5424-7488)
Feng Zhang
Yury Yuryevich Illarionov
Theresia Knobloch
Peng Wu
Michael Waltl
Alexander Grill
Joerg Appenzeller
Tibor Grasser
application/pdf
research-article
http://pubs.acs.org/doi/suppl/10.1021/acsnano.8b00268
© XXXX American Chemical Society
American Chemical Society
True
© XXXX American Chemical Society
© XXXX American Chemical Society
ASAP
10.1021/acsnano.8b00268
VoR
06/07/2018
© XXXX American Chemical Society
article
1936-0851
1936-086X
ACS Nano
research-article
ASAP10.1021/acsnano.8b00268VoR
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