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application/pdfIEEEIEEE Transactions on Device and Materials Reliability;2019;19;1;10.1109/TDMR.2019.2891794Low-voltage trench MOSFETcharge pumpingCharge Pumping of Low-Voltage Silicon Trench Powers MOSFETsBernhard RuchGregor PobegenMaximilian RoschRajeev Krishna VytlaTibor Grasser
IEEE Transactions on Device and Materials Reliability133 March 201911910.1109/TDMR.2019.2891794139
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