Activities
Erasmus Langer
Siegfried Selberherr
Preface
Hajdin Ceric
Microstructure and Stress Aspects of Electromigration Modeling
Johann Cervenka
Improvement of Topography Simulation Tools
Siddhartha Dhar
Modeling and Simulation of Strained Si CMOS Transistors
Robert Entner
Modeling and Simulation of Negative Bias Temperature Instability
Wolfgang Gös
Simulation of the Processes in MOSFETs
Klaus-Tibor Grasser
Hydrogen in Semiconductors
René Heinzl
A Generic Scientific Simulation Environment (GSSE)
Christian Hollauer
Modeling of Intrinsic Stress Effects in Deposited Thin Films
Stefan Holzer
Optimization and Inverse Modeling in TCAD Applications
Andreas Hössinger
Characterization of Ion Implantation for non-Si Materials
Gerhard Karlowatz
Fullband Monte-Carlo Simulation of Carrier Transport in Arbitrarily Strained Semiconductors
Markus Karner
A Multi-Purpose Schrödinger-Poisson Solver for TCAD Applications
Hans Kosina
Physical Modeling of Novel Devices and Materials
Ling Li
Organic Transistors' Model
Gregor Meller
Simulation of Organic Semiconductor Devices
Mihail Nedjalkov
Ultrafast Wigner Transport in Quantum Wires
Alexandre Nentchev
Three-Dimensional Interconnect Simulation
Vassil Palankovski
Analysis and Simulation of Advanced Heterostructure Devices
Mahdi Pourfath
Quantum Transport in Nanostructures
Philipp Schwaha
Library-Centric Application Design with Modern Programming Paradigms
Alireza Sheikholeslami
Topography Simulation
Michael Spevak
Computational Topology and Its Applications to Scientific Computing
Viktor Sverdlov
The Wigner Monte Carlo Method for Semiconductor Device Simulation
Oliver Triebl
Snap-Back Simulation in Smart Power Devices
Enzo Ungersboeck
Physical Modeling of Electron Mobility Enhancement for Arbitrarily Strained Silicon
Martin-Thomas Vasicek
Higher-Order Macroscopic Transport Models for Advanced Semiconductor Devices
Stanislav Vitanov
Simulation of Heterostructure Field Effect Transistors
Martin Wagner
Simulation and Optimization of Thermoelectric Generators
Wilfried Wessner
Mesh Refinement Techniques for TCAD Tools
Robert Wittmann
Investigation of Doping Profiles and Reliability for CMOS Technology
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