Activities
Erasmus Langer
Siegfried Selberherr
Preface
Hajdin Ceric Microstructure and Stress Aspects of Electromigration Modeling
Johann Cervenka Improvement of Topography Simulation Tools
Siddhartha Dhar Modeling and Simulation of Strained Si CMOS Transistors
Robert Entner Modeling and Simulation of Negative Bias Temperature Instability
Wolfgang Gös Simulation of the Processes in MOSFETs
Klaus-Tibor Grasser Hydrogen in Semiconductors
René Heinzl A Generic Scientific Simulation Environment (GSSE)
Christian Hollauer Modeling of Intrinsic Stress Effects in Deposited Thin Films
Stefan Holzer Optimization and Inverse Modeling in TCAD Applications
Andreas Hössinger Characterization of Ion Implantation for non-Si Materials
Gerhard Karlowatz Fullband Monte-Carlo Simulation of Carrier Transport in Arbitrarily Strained Semiconductors
Markus Karner A Multi-Purpose Schrödinger-Poisson Solver for TCAD Applications
Hans Kosina Physical Modeling of Novel Devices and Materials
Ling Li Organic Transistors' Model
Gregor Meller Simulation of Organic Semiconductor Devices
Mihail Nedjalkov Ultrafast Wigner Transport in Quantum Wires
Alexandre Nentchev Three-Dimensional Interconnect Simulation
Vassil Palankovski Analysis and Simulation of Advanced Heterostructure Devices
Mahdi Pourfath Quantum Transport in Nanostructures
Philipp Schwaha Library-Centric Application Design with Modern Programming Paradigms
Alireza Sheikholeslami Topography Simulation
Michael Spevak Computational Topology and Its Applications to Scientific Computing
Viktor Sverdlov The Wigner Monte Carlo Method for Semiconductor Device Simulation
Oliver Triebl Snap-Back Simulation in Smart Power Devices
Enzo Ungersboeck Physical Modeling of Electron Mobility Enhancement for Arbitrarily Strained Silicon
Martin-Thomas Vasicek Higher-Order Macroscopic Transport Models for Advanced Semiconductor Devices
Stanislav Vitanov Simulation of Heterostructure Field Effect Transistors
Martin Wagner Simulation and Optimization of Thermoelectric Generators
Wilfried Wessner Mesh Refinement Techniques for TCAD Tools
Robert Wittmann Investigation of Doping Profiles and Reliability for CMOS Technology
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