Activities
Erasmus Langer
Siegfried Selberherr
Preface
Oskar Baumgartner Modeling the Effects of Band Structure and Transport in Quantum Cascade Lasers and Detectors
Markus Bina Modeling of Hot-Carrier Degradation Using a Spherical Harmonics Expansion of the Bipolar Boltzmann Transport Equation
Hajdin Ceric Reliability of Interconnect Structures in 3D ICs
Johann Cervenka Deterministic Wigner Approach
Raffaele Coppeta Modeling of the Residual Stress in GaN Thin Film Grown on Si Substrate
Lado Filipovic Advanced Topography Simulation Techniques for Novel Semiconductor Processes
Lidija Filipovic Tunneling in TFET Nanowire Hetorostructures
Wolfgang Gös Gate Current Fluctuations in pMOSFETs
Klaus-Tibor Grasser On the Microscopic Origin of Frequency Dependence of Hole Capture
Hossein Karamitaheri Ballistic Thermal Conductance of Silicon-Based Nanostructures
Hans Kosina Modeling of Nano-Structures for Electronic, Optical, and Thermoelectric Applications
Hiwa Mahmoudi Design and Applications of the MTJ-Based Implication Logic Gate
Alexander Makarov Structural Optimization of MTJs with a Composite Free Layer
Mahdi Moradinasab Nonlinearity in Quantum Cascade Lasers
Mihail Nedjalkov Wigner Quasi-Particles – an Asymptotic Perspective
Neophytos Neophytou Modeling of Ultra-Thin-Layer Si Devices for Thermoelectric Applications
Roberto Orio Electromigration Failure in Copper Interconnect Ended by a Through Silicon Via
Dmitry Osintsev Influence of Surface Roughness Scattering on Spin Lifetime in Silicon
Mahdi Pourfath Cross-Correlated Line-Edge Roughness in GNRs
Florian Rudolf Highly Flexible Mesh Generation for Physical Simulation
Franz Schanovsky The Microscopic Reaction-Diffusion Model: Evaluation against Experimental Data
Anderson Singulani Stress Evolution on Tungsten Thin-Film of an Open TSV Technology
Zlatan Stanojevic Dimension-Independent Modeling of Microoptical Systems
Viktor Sverdlov Modeling Spin-Based Devices in Silicon
Stanislav Tyaginov Impact of Gate Oxide Thickness Variations on Hot-Carrier Degradation
Michael Waltl Advanced Data Analysis Algorithms for the Time Dependent Defect Spectroscopy Measurement Data of Bias Temperature Instabilities
Josef Weinbub ViennaX: Task and Data Parallelism for Scientific Computing
Yannick Wimmer Refinement of the Hot-Carrier Degradation Model
Thomas Windbacher Spintronics - Advancing Towards Fully Non-Volatile Information Processing Systems
Wolfhard Zisser Electromigration on the Interface of Aluminum to Tungsten in TSVs
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