Activities
Erasmus Langer
Siegfried Selberherr
Preface
Oskar Baumgartner
Modeling the Effects of Band Structure and Transport in Quantum Cascade Lasers and Detectors
Markus Bina
Modeling of Hot-Carrier Degradation Using a Spherical Harmonics Expansion of the Bipolar Boltzmann Transport Equation
Hajdin Ceric
Reliability of Interconnect Structures in 3D ICs
Johann Cervenka
Deterministic Wigner Approach
Raffaele Coppeta
Modeling of the Residual Stress in GaN Thin Film Grown on Si Substrate
Lado Filipovic
Advanced Topography Simulation Techniques for Novel Semiconductor Processes
Lidija Filipovic
Tunneling in TFET Nanowire Hetorostructures
Wolfgang Gös
Gate Current Fluctuations in pMOSFETs
Klaus-Tibor Grasser
On the Microscopic Origin of Frequency Dependence of Hole Capture
Hossein Karamitaheri
Ballistic Thermal Conductance of Silicon-Based Nanostructures
Hans Kosina
Modeling of Nano-Structures for Electronic, Optical, and Thermoelectric Applications
Hiwa Mahmoudi
Design and Applications of the MTJ-Based Implication Logic Gate
Alexander Makarov
Structural Optimization of MTJs with a Composite Free Layer
Mahdi Moradinasab
Nonlinearity in Quantum Cascade Lasers
Mihail Nedjalkov
Wigner Quasi-Particles – an Asymptotic Perspective
Neophytos Neophytou
Modeling of Ultra-Thin-Layer Si Devices for Thermoelectric Applications
Roberto Orio
Electromigration Failure in Copper Interconnect Ended by a Through Silicon Via
Dmitry Osintsev
Influence of Surface Roughness Scattering on Spin Lifetime in Silicon
Mahdi Pourfath
Cross-Correlated Line-Edge Roughness in GNRs
Florian Rudolf
Highly Flexible Mesh Generation for Physical Simulation
Franz Schanovsky
The Microscopic Reaction-Diffusion Model: Evaluation against Experimental Data
Anderson Singulani
Stress Evolution on Tungsten Thin-Film of an Open TSV Technology
Zlatan Stanojevic
Dimension-Independent Modeling of Microoptical Systems
Viktor Sverdlov
Modeling Spin-Based Devices in Silicon
Stanislav Tyaginov
Impact of Gate Oxide Thickness Variations on Hot-Carrier Degradation
Michael Waltl
Advanced Data Analysis Algorithms for the Time Dependent Defect Spectroscopy Measurement Data of Bias Temperature Instabilities
Josef Weinbub
ViennaX: Task and Data Parallelism for Scientific Computing
Yannick Wimmer
Refinement of the Hot-Carrier Degradation Model
Thomas Windbacher
Spintronics - Advancing Towards Fully Non-Volatile Information Processing Systems
Wolfhard Zisser
Electromigration on the Interface of Aluminum to Tungsten in TSVs
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