List of Publications

1

T. Ayalew, A. Gehring, J. M. Park, T. Grasser, and S. Selberherr, "Improving SiC Lateral DMOSFET Reliability Under High Field Stress," Journal of Microeectronics Reliability, vol. 43, no. 9-11, pp. 1889-1894, 2003.

2

T. Ayalew, J. M. Park, A. Gehring, T. Grasser, and S.Selberherr, "Modeling and Simulation of SiC MOSFETs," in Proceedings of the 12th IASTED Intl. Conf. on Aplied Simulation and Modeling, ASM'2003, pp. 552-556, Marbella, Spain, Sept. 3-5, 2003.

3

T. Ayalew, J. M. Park, A. Gehring, T. Grasser, and S. Selberherr, "Silicon Carbide Accumulation-Mode Laterally Diffused MOSFET," in Proceedings of the 33rd European Solid-State Device Research Conference, ESSDERC'2003, pp. 581-584, Estoril, Portugal, Sept. 16-18, 2003.

4

T. Ayalew, A. Gehring, J. M. Park, T. Grasser, and S. Selberherr, "Improving SiC Lateral DMOSFET Reliability Under High Field Stress," in Proceedings of the 14th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis, ESREF'2003, pp. 1889-1894, Bordeaux, France, October 7-10, 2003.

T. Ayalew: SiC Semiconductor Devices Technology, Modeling, and Simulation