3 Measurement and Parameter Extraction

To investigate HEMTs by simulation the results have to be verified by measurements of manufactured devices. To do this the comparability of measured and simulated data has to be guaranteed.
 

• 3.1 DC and RF Measurements
• 3.2 Small Signal Equivalent Circuit Parameter Extraction
• 3.3 Determination of Capacitances by Quasi Static Approximation

   
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