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Next: 2.1.9 Device Matching Up: 2.1 TCAD Tasks Previous: 2.1.7 Sensitivity Analysis

2.1.8 Design Centering and Yield Optimization

 

As opposed to the ``ideal'' world of computer simulation, where numbers are exact, the real fabrication process has to deal with fluctuations and variations in all parameters. Therefore, for a given process and given process parameters, the measured electrical characteristics of the fabricated devices vary within certain rangesgif. These variations are modeled as appearing at the input of the fabrication units, e.g., a statistical variation is assigned to a process parameter, with the system itself assumed to behave completely deterministic. The parameters of these statistical variations can be obtained from long-term measurements in the fabrication unit. Given a model of the fabrication process - either a sequence of process simulators of a global model -, a large number of experiments can be generated from the nominal values and the statistical parametersgif. In order to optimize the yield of the product, the fraction of experiments that leads to results that fall into the manufacture acceptance  window has to be maximized. By adjusting the nominal process parameter values, the design is centered with respect to the output distribution. In practical applications, the system is represented by a response surface model, and experiments are generated by using the Monte Carlo   methodgif. Figure 2.5 shows the experimental loop used for design centering.

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Christoph Pichler
Thu Mar 13 14:30:47 MET 1997