Publications Arash Abbasi
2 recordsPublications in Scientific Journals
| 1. | Stampfer, B., Simicic, M., Weckx, P., Abbasi, A., Kaczer, B., Grasser, T., Waltl, M. (2020). Extraction of Statistical Gate Oxide Parameters From Large MOSFET Arrays. IEEE Transactions on Device and Materials Reliability, 20(2), 251–257. https://doi.org/10.1109/tdmr.2020.2985109 (reposiTUm) | |
Talks and Poster Presentations (with Proceedings-Entry)
| 1. | Stampfer, B., Simicic, M., Weckx, P., Abbasi, A., Kaczer, B., Grasser, T., Waltl, M. (2019). Statistical Characterization of BTI and RTN Using Integrated pMOS Arrays. In 2019 IEEE International Integrated Reliability Workshop (IIRW), South Lake Tahoe, CA, USA. https://doi.org/10.1109/iirw47491.2019.8989904 (reposiTUm) | |