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Publications Robert Entner

17 records

Publications in Scientific Journals

2.   Entner, R., Grasser, T., Triebl, O., Enichlmair, H., Minixhofer, R. (2007).
Negative Bias Temperature Instability Modeling for High-Voltage Oxides at Different Stress Temperatures.
Microelectronics Reliability, 47(4–5), 697–699. (reposiTUm)

1.   Karner, M., Gehring, A., Wagner, M., Entner, R., Holzer, S., Goes, W., Vasicek, M., Grasser, T., Kosina, H., Selberherr, S. (2007).
VSP - A Gate Stack Analyzer.
Microelectronics Reliability, 47(4–5), 704–708. https://doi.org/10.1016/j.microrel.2007.01.059 (reposiTUm)

Talks and Poster Presentations (with Proceedings-Entry)

10.   Entner, R., Grasser, T., Enichlmair, H., Minixhofer, R. (2006).
Influence of Interface and Oxide Traps on Negative Bias Temperature Instability.
In Abstracts IEEE 2006 Silicon Nanoelectronics Workshop (pp. 163–164), Honolulu. (reposiTUm)

9.   Entner, R., Grasser, T., Enichlmair, H., Minixhofer, R. (2006).
Investigation of NBTI Recovery During Measurement.
In San Francisco 2006 MRS Meeting Abstracts (pp. 110–111), San Francisco. (reposiTUm)

8.   Entner, R., Grasser, T., Enichlmair, H., Minixhofer, R. (2006).
Negative Bias Temperature Instability Modeling for High-Voltage Oxides at Different Stress Temperatures.
In WODIM 2006 14th Workshop on Dielectrics in Microelectronics Workshop Programme and Abstracts (pp. 96–97), Catania. (reposiTUm)

7.  T. Grasser, R. Entner, O. Triebl, H. Enichlmair:
"TCAD Modeling of Negative Bias Temperature Instability";
Talk: International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), Monterey, CA, USA; 2006-09-06 - 2006-09-08; in: "Proceedings of the International Conference on Simulation of Semiconductor Processes and Devices (SISPAD)", (2006), ISBN: 1-4244-0404-5; 330 - 333. https://doi.org/10.1109/SISPAD.2006.282902

6.   Karner, M., Gehring, A., Wagner, M., Entner, R., Holzer, S., Gös, W., Vasicek, M., Grasser, T., Kosina, H., Selberherr, S. (2006).
VSP-A Gate Stack Analyzer.
In WODIM 2006 14th Workshop on Dielectrics in Microelectronics Workshop Program and Abstracts (pp. 101–102), Catania. (reposiTUm)

5.   Entner, R., Gehring, A., Kosina, H., Grasser, T., Selberherr, S. (2005).
Impact of Multi-Trap Assisted Tunneling on Gate Leakage of CMOS Memory Devices.
In NSTI Nanotech Technical Proceedings (pp. 45–48), Anaheim, Austria. (reposiTUm)

4.   Entner, R., Gehring, A., Kosina, H., Grasser, T., Selberherr, S. (2005).
Modeling of Tunneling Currents for Highly Degraded CMOS Devices.
In 2005 International Conference On Simulation of Semiconductor Processes and Devices, Tokyo, Japan. https://doi.org/10.1109/sispad.2005.201512 (reposiTUm)

3.   Holzer, S., Hollauer, C., Ceric, H., Wagner, S., Entner, R., Langer, E., Grasser, T., Selberherr, S. (2005).
Three-Dimensional Transient Electro-Thermal Interconnect Simulation for Stress and Electromigration Analysis.
In NSTI Nanotech Technical Proceedings (pp. 620–623), Anaheim, Austria. (reposiTUm)

2.  R. Entner, A. Gehring, T. Grasser, S. Selberherr:
"A Comparison of Quantum Correction Models for the Three-Dimensional Simulation of FinFET Structures";
Poster: International Spring Seminar on Electronics Technology (ISSE), Sofia; 2004-05-13 - 2004-05-16; in: "Proceedings IEEE International Spring Seminar on Electronics Technology 27th ISSE 2004", IEEE, 1 (2004), ISBN: 0-7803-8422-9; 114 - 117.

1.  R. Kosik, T. Grasser, R. Entner, K. Dragosits:
"On the Highest Order Moment Closure Problem";
Poster: International Spring Seminar on Electronics Technology (ISSE), Sofia; 2004-05-13 - 2004-05-16; in: "Proceedings IEEE International Spring Seminar on Electronics Technology 27th ISSE 2004", IEEE, 1 (2004), ISBN: 0-7803-8422-9; 118 - 120.

Doctor's Theses (authored and supervised)

1.  R. Entner:
"Modeling and Simulation of Negative Bias Temperature Instability";
Supervisor, Reviewer: T. Grasser, G. Magerl; Institut für Mikroelektronik, 2007; oral examination: 2007-08-13. https://doi.org/10.34726/hss.2007.10123

Diploma and Master Theses (authored and supervised)

1.   Entner, R. (2003).
Three-Dimensional Device Simulation With Minimos-Nt Using the Wafer-State-Server
 Technische Universität Wien. https://resolver.obvsg.at/urn:nbn:at:at-ubtuw:1-12227 (reposiTUm)

Scientific Reports

3.   Grasser, T., Gös, W., Triebl, O., Hehenberger, P. P., Wagner, P.-J., Schwaha, P., Heinzl, R., Holzer, S., Entner, R., Wagner, S., Schanovsky, F. (2007).
3 Year Report 2005-2007.
(reposiTUm)

2.   Entner, R., Heinzl, R., Nentchev, A., Ungersböck, S. E., Wagner, M., Selberherr, S. (2006).
VISTA Status Report December 2006.
(reposiTUm)

1.   Entner, R., Heinzl, R., Hollauer, C., Sheikholeslami, A., Wittmann, R., Selberherr, S. (2005).
VISTA Status Report June 2005.
(reposiTUm)