Publications Ernst Strasser
15 recordsPublications in Scientific Journals
4. | E. Strasser, S. Selberherr: "Algorithms and Models for Cellular Based Topography Simulation"; IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, 14 (1995), 9; 1104 - 1114. https://doi.org/10.1109/43.406712 | |
3. | H. Stippel, E. Leitner, C. Pichler, H. Puchner, E. Strasser, S. Selberherr: "Process Simulation for the 1990s"; Microelectronics Journal (invited), 26 (1995), 2-3; 203 - 215. https://doi.org/10.1016/0026-2692(95)98922-E | |
2. | S. Halama, F. Fasching, C. Fischer, H. Kosina, E. Leitner, P. Lindorfer, C. Pichler, H. Pimingstorfer, H. Puchner, G. Rieger, G. Schrom, T. Simlinger, M. Stiftinger, H. Stippel, E. Strasser, W. Tuppa, K. Wimmer, S. Selberherr: "The Viennese Integrated System for Technology CAD Applications"; Microelectronics Journal, 26 (1995), 137 - 158. https://doi.org/10.1016/0026-2692(95)98918-H | |
1. | E. Strasser, G. Schrom, K. Wimmer, S. Selberherr: "Accurate Simulation of Pattern Transfer Processes Using Minkowski Operations"; IEICE Transactions on Electronics, E77-C (1994), 2; 92 - 97. | |
Talks and Poster Presentations (with Proceedings-Entry)
8. | E. Leitner, W. Bohmayr, P. Fleischmann, E. Strasser, S. Selberherr: "3D TCAD at TU Vienna"; Talk: 3-Dimensional Process Simulation Workshop, Erlangen (invited); 1995-09-05; in: "Proceedings 3-Dimensional Process Simulation Workshop", (1995), ISBN: 3-211-82741-2; 136 - 161. https://doi.org/10.1007/978-3-7091-6905-6_7 | |
7. | R. Mlekus, C. Ledl, E. Strasser, S. Selberherr: "Polygonal Geometry Reconstruction after Cellular Etching or Deposition Simulation"; Talk: International Conference on the Simulation of Semiconductor Devices and Processes (SISDEP), Erlangen; 1995-09-06 - 1995-09-08; in: "Proceedings SISDEP 95 Conference", (1995), ISBN: 3-211-82736-6; 50 - 53. https://doi.org/10.1007/978-3-7091-6619-2_11 | |
6. | E. Strasser, S. Selberherr: "Three-Dimensional Models and Algorithms for Wafer Topography Evaluation"; Talk: Microelectronics Conference, Zvenigorod (invited); 1994-11-28 - 1994-12-03; in: "Proceedings Microelectronics '94", (1994), 23 - 24. | |
5. | E. Strasser, S. Selberherr: "Three-Dimensional Simulation of Step Coverage for Contact Hole Metallization"; Talk: European Solid-State Device Research Conference (ESSDERC), Edinburgh; 1994-09-11 - 1994-09-15; in: "Proceedings of the European Solid-State Device Research Conference (ESSDERC)", (1994), ISBN: 2-86332-157-9; 339 - 342. | |
4. | E. Strasser, S. Selberherr: "A General Simulation Method for Etching and Deposition Processes"; Talk: International Conference on the Simulation of Semiconductor Devices and Processes (SISDEP), Wien; 1993-09-07 - 1993-09-09; in: "Proceedings SISDEP 93 Conference", (1993), ISBN: 3-211-82504-5; 357 - 360. https://doi.org/10.1007/978-3-7091-6657-4_88 | |
3. | E. Strasser, K. Wimmer, S. Selberherr: "A New Method for Simulation of Etching and Deposition Processes"; Talk: VLSI Process and Device Modeling Workshop (VPAD), Nara; 1993-05-14 - 1993-05-15; in: "Proceedings VPAD Workshop", (1993), ISBN: 0-7803-1338-0; 54 - 55. | |
2. | E. Strasser, S. Selberherr: "Analysis of the Fabrication Process of Multilayer Vertical Stacked Capacitors"; Talk: European Solid-State Device Research Conference (ESSDERC), Grenoble; 1993-09-13 - 1993-09-16; in: "Proceedings of the European Solid-State Device Research Conference (ESSDERC)", (1993), ISBN: 2-86332-135-8; 587 - 590. | |
1. | S. Halama, F. Fasching, C. Fischer, H. Kosina, E. Leitner, C. Pichler, H. Pimingstorfer, H. Puchner, G. Rieger, G. Schrom, T. Simlinger, M. Stiftinger, H. Stippel, E. Strasser, W. Tuppa, K. Wimmer, S. Selberherr: "The Viennese Integrated System for Technology CAD Applications"; Talk: Workshop on Technology CAD Systems, Wien (invited); 1993-09-06; in: "Proceedings Technology CAD Systems Workshop", (1993), ISBN: 3-211-82505-3; 197 - 236. https://doi.org/10.1007/978-3-7091-9315-0_10 | |
Doctor's Theses (authored and supervised)
1. | E. Strasser: "Simulation von Topographieprozessen in der Halbleiterfertigung"; Supervisor, Reviewer: S. Selberherr, W. Fallmann; Institut für Mikroelektronik, 1994; oral examination: 1994-11-17. | |
Scientific Reports
2. | W. Bohmayr, S. Halama, C. Pichler, S. Selberherr, T. Simlinger, E. Strasser, W. Tuppa: "VISTA Status Report June 1994"; 1994; 25 pages. | |
1. | S. Halama, C. Pichler, G. Rieger, S. Selberherr, T. Simlinger, H. Stippel, E. Strasser: "VISTA Status Report December 1993"; 1993; 19 pages. | |