On April, 5th our team member Markus Kampl defended his PhD thesis “Investigating Hot-Carrier Effects using the Backward Monte Carlo Method” with distinction. Markus’ has decided to remain at the Institute for Microelectronics and in the SDS team as a post-doctoral researcher and his work will continue to focus on developing measurement tools and characterization of single defects in large-area transistors.
Special thanks go to the defense committee chaired by Prof. Dr. Erich Gornik, TU Wien, Austria, his supervisor Ao. Prof. Dr. Hans Kosina, TU Wien, Austria and the assessors and examiners: Ao. Prof. Dr. Gerhard Hobl, TU Wien, Austria and Prof. Antonio Garcia Loureiro, University of Santiago de Compostela, Spain.
Congratulations, Markus!