On August 30th our colleague Christian Schleich successfully defended his dissertation. Christian’s PhD work focused on characterization and modelling of reliability phenomena in SiC power MOSFETs in the framework of the Christian Doppler Laboratory for Single Defect Spectroscopy (SDS) project which is jointly funded by the Christian Doppler Research Association and by our partners Infineon Technologies Austria, GTS and ams-OSRAM. As he decided to continue his career in industry we congratulate and wish him all the best for the future!
Special thanks go to the dissertation committee:
- Univ.-Prof.Dr. Wolfgang Gawlik (TU Wien, Austria)
Supervisor and Examiner:
- Univ.-Prof.Dr. Tibor Grasser (TU Wien, Austria)
- Prof. Daniel Fleetwood (Vanderbilt School of Engineering, US)
- Prof. Susanna Regianni (Universita di Bologna, Italy)