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IEEE
IEEE Transactions on Device and Materials Reliability;2021;21;2;10.1109/TDMR.2021.3080983
On the Distribution of Single Defect Threshold Voltage Shifts in SiON Transistors
SiON nanoscale devices
single oxide defects
positive and negative bias temperature instability (PBTI, NBTI)
complementary cumulative distribution function (CCDF)
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