3.2.1 Bandgap-Energy

It has been reported that the photoluminescence measurements yielded an exciton energy gap $ E_\mathrm{gx}$ of 3.265 eV [112] and 3.023 eV [116] at T = 4.2 K for 4H- and 6H-SiC, respectively. The absorption measurements value obtained for $ \alpha $-SiC (most likely 6H-SiC) yield the temperature dependence of $ E_\mathrm{gx}$ 2.6 eV to 3.03 eV at temperatures from 77K to 717K [116]. The minimum energy gap is found to be 2.86 eV at 300 K, and above this temperature d $ E_{\mathrm{g}}$/d $ T_\mathrm{L}=-3.3\times 10^{-4}$ ev/K.


The temperature dependence of 4H-SiC is assumed to be similar to the temperature dependence of 6H-SiC as long as no further experimental data is available. At present there are no reliably measured values about the binding energy $ E_{x}$ of free exciton in any $ \alpha $-SiC polytype [117]. The values, however, required in order to obtain the indirect bandgap, which is given by

$\displaystyle E_{\mathrm{g}}= E_\mathrm{gx}+E_\mathrm{x}.$ (3.63)

Results obtained by comparing experimental data with a theory claim the values of $ E_\mathrm{x}$ range from 10-80 meV [117]. Hence, a mean indirect bandgap can be assumed by shifting $ E_\mathrm{gx}$ by 20 meV and 40 meV for 4H- and 6H-SiC, respectively. These measured data for two different temperature ranges can be piecewise modeled by

$\displaystyle E_{\mathrm{g}}(T)=E_{\mathrm{g}}^{T_{0}}-\alpha ^{E_{\mathrm{g}}}\cdot\frac{T_\mathrm{L}^{2}}{\beta ^{E_{\mathrm{g}}}+T_\mathrm{L}}\,.$ (3.64)

Fig. 3.5 depicts the resulting temperature dependence of the bandgap energy in $ \alpha $-SiC.

Table 3.2: Temperature dependent measured exciton energy gap in $ \alpha $-SiC.
 
$ E_{g}^{T_{0}}$
[eV]
$ \alpha ^{E_{g}}$
[eV/K]
$ \beta ^{E_{g}}$
[K]
$ T_\mathrm{L}$
[K]
4H-SiC $ 3.265$ $ 3.3\times 10^{-2}$ $ 1.0\times 10^{5}$ $ 4-700$
6H-SiC $ 3.023$ $ 3.3\times 10^{-2}$ $ 1.0\times 10^{5}$ $ 4-700$


Figure 3.5: Temperature dependence of bandgap energy in $ \alpha $-SiC.
\includegraphics[width=0.55\linewidth]{figures/bandgap.eps}
T. Ayalew: SiC Semiconductor Devices Technology, Modeling, and Simulation