3 Measurement and Parameter Extraction
To investigate HEMTs by simulation the results have to be verified by
measurements of manufactured devices. To do this the comparability of measured
and simulated data has to be guaranteed.
Next: 3.1 DC and RF Measurements Up: Dissertation Helmut Brech Previous: 2.3 Limitations of the Barrier Material AlGaAs
Helmut Brech 1998-03-11