Own Publications

1

M. Vasicek, V. Sverdlov, J. Cervenka, T. Grasser, H. Kosina, and S. Selberherr ``Transport in Nanostrucures: A Comparative Analysis Using Monte Carlo Simulation, the Spherical Harmonic Method, and Higher Moments Models'' in 7th International Conference on Large-Scale Scientific Computations, 2009.

2

M. Vasicek, T. Grasser, ``Advanced Macroscopic Transport Models'' in Quantum Systems and Devices: Analysis, Simulations, Applications, pp. 32, 2009.

3

M. Vasicek, M. Cervenka, M. Karner, and T. Grasser, ``Consistent Higher-Order Transport Models for SOI MOSFETs'' in International Conference on Simulation of Semiconductor Processes and Devices 2008, pp. 129-132, 2008.

4

M. Karner, O. Baumgartner, M. Pourfath, M. Vasicek, and H. Kosina, ``Investigation of a MOSCAP Using NEGF'' in 2007 International Semiconductor Device Research Symposium, 2007.

5

M. Vasicek, J. Cervenka, M. Wagner, M. Karner, T. Grasser, ``A 2D Non-Parabolic Six-Moments Model'' J.Solid State Electronics, vol. 3, pp. 168-173, 2008.

6

M. Vasicek, J. Cervenka, M. Wagner, M. Karner, and T. Grasser, ``A 2D-Non-Parabolic Six Moments Model'' in 2007 International Semiconductor Device Research Symposium, 2007.

7

M. Vasicek, J. Cervenka, M. Karner, M. Wagner, T. Grasser, ``Parameter Modeling for Higher-Order Transport Models in UTB SOI MOSFETs'' J.Comput.Electronics, vol. 3, pp. 168-173, 2008.

8

M. Vasicek, J. Cervenka, M. Karner, M. Wagner, and T. Grasser, ``Parameter Modeling for Higher-Order Transport Models in UTB SOI MOSFETs,'' in 12th International Workshop on Computational Electronics Book of Abstracts, pp. 96-97, 2007.

9

M. Vasicek, M. Karner, E. Ungersböck, M. Wagner, H. Kosina, and T. Grasser, ``Modeling of Macroscopic Transport Parameters in Inversion Layers,'' in International Conference on Simulation of Semiconductor Processes and Devices 2007, pp. 201-204, 2007.

10

T. Grasser, M. Vasicek, and M. Wagner, ``Higher-Order Moment Models for Engineering Applications,'' in Equadiff, Wien, 2007.

11

M. Wagner, M. Karner, J. Cervenka, M. Vasicek, H. Kosina, S. Holzer, and T. Grasser, ``Quantum Correction for DG MOSFETs,'' J.Comput.Electronics, vol. 5, pp. 397-400, 2007.

12

M. Karner, A. Gehring, S. Holzer, M. Pourfath, M. Wagner, W. Gös, M. Vasicek, O. Baumgartner, C. Kernstock, K. Schnass, G. Zeiler, T. Grasser, H. Kosina, and S. Selberherr, ``A Multi-Purpose Schrödinger-Poisson Solver for TCAD Applications,'' J.Comput.Electronics, vol. 6, pp. 179-182, 2007.

13

M. Karner, A. Gehring, M. Wagner, R. Entner, S. Holzer, W. Gös, M. Vasicek, T. Grasser, H. Kosina, and S. Selberherr, ``VSP-A Gate Stack Analyzer,'' in WODIM 2006 14th Workshop on Dielectrics in Microelectronics Workshop Programme and Abstracts, pp. 101-102, 2006.

14

M. Karner, S. Holzer, W. Gös, M. Vasicek, M. Wagner, H. Kosina, and S. Selberherr, Physics and Technology of High-k Gate Dielectrics 4, vol. 3, ch. Numerical Analysis of Gate Stacks, pp. 299-308.
The Electrochemical Society; ECS Transactions, 2006.

15

M. Karner, S. Holzer, M. Vasicek, W. Gös, M. Wagner, H. Kosina, and S. Selberherr, ``Numerical Analysis of Gate Stacks,'' in Meeting Abstracts 2006 Joint International Meeting, p. 1119, Meeting of the Electrochemical Society (ECS), Cancun, 2006.