Publications Lukas Cvitkovich
6 records
| 2. | C. Wilhelmer, D. Waldhör, M. Jech, A.-M. El-Sayed, L. Cvitkovich, M. Waltl, T. Grasser: "Ab initio investigations in amorphous silicon dioxide: Proposing a multi-state defect model for electron and hole capture"; Microelectronics Reliability, 139, (2022), doi:10.1016/j.microrel.2022.114801. BibTeX |
| 1. | L. Cvitkovich, D. Zocco, Gaku Eguchi, M. Waas, R. Svagera, R. Mondal, A. Thamizhavel, S. Paschen, M. Stöger-Pollach: "Anisotropic Physical Properties of the Kondo Semimetal CeCu1.11As2"; JPS Conference Proceedings, 30, (2020), 1 - 6 doi:10.7566/JPSCP.30.011020. BibTeX |
| 4. | L. Cvitkovich, D. Waldhör, A.-M. El-Sayed, M. Jech, C. Wilhelmer, T. Grasser: "Ab-Initio Modeling of the Initial Stages of Si(100) Thermal Oxidation"; Poster: Psi-K Conference (Psi-K) 2022, Lausanne, Schwitzerland; 2022-08-22 - 2022-08-25; in "PSI-K 2022: abstracts book", (2022), 209. BibTeX |
| 3. | C. Wilhelmer, D. Waldhör, M. Jech, A.-M. El-Sayed, L. Cvitkovich, M. Waltl, T. Grasser: "Ab-Initio Study of Multi-State Defects in Amorphous SiO2"; Talk: Psi-K Conference (Psi-K) 2022, Lausanne, Schwitzerland; 2022-08-22 - 2022-08-25; in "PSI-K 2022: abstracts book", (2022), 264. BibTeX |
| 2. | L. Cvitkovich, M. Jech, D. Waldhör, A.-M. El-Sayed, C. Wilhelmer, T. Grasser: "Multiscale Modeling Study of Native Oxide Growth on a Si(100) Surface"; Talk: European Solid-State Device Research Conference (ESSDERC), Grenoble, France; 2021-09-13 - 2021-09-22; in "Proceedings of the European Solid-State Device Research Conference (ESSDERC)", (2021), ISBN: 978-1-6654-3748-6, 235 - 238 doi:10.1109/ESSDERC53440.2021.9631790. BibTeX |
| 1. | C. Wilhelmer, M. Jech, D. Waldhör, A.-M. El-Sayed, L. Cvitkovich, T. Grasser: "Statistical Ab Initio Analysis of Electron Trapping Oxide Defects in the Si/SiO2 Network"; Talk: European Solid-State Device Research Conference (ESSDERC), Grenoble, France; 2021-09-13 - 2021-09-22; in "Proceedings of the European Solid-State Device Research Conference (ESSDERC)", (2021), ISBN: 978-1-6654-3748-6, 243 - 246 doi:10.1109/ESSDERC53440.2021.9631833. BibTeX |