Publications Predrag Habas
25 records
14. | P. Habas, G. Groeseneken, G. Van den Bosch, H.E. Maes, E. Gornik: "Detailed Study of the Parasitic Geometric Current Component in Charge Pumping Measurements"; Talk: Semiconductor Interface Specialists Conference, Charleston; 1997-12-01 in "Proc. of Semiconductor Interface Specialists Conf.", (1997), 1. BibTeX |
13. | D. Pogany, C. Fürböck, N. Seliger, P. Habas, E. Gornik, S. Kubicek, S. Decoutere: "Optical testing of submicron-technology MOSFET`s and bipolar transistors"; Talk: European Solid-State Device Research Conference (ESSDERC), Stuttgart; 1997-09-01 in "Proc. ESSDERC ´97", (1997), 372 - 375. BibTeX |
12. | N. Seliger, D. Pogany, C. Fürböck, P. Habas, E. Gornik, M. Stoisiek: "A study of temperature distribution in SOI-smart power devices in transient conditions by optical interferometry"; Talk: European Solid-State Device Research Conference (ESSDERC), Stuttgart; 1997-09-01 in "Proc. ESSDERC ´97", (1997), 512 - 515. BibTeX |
11. | N. Seliger, P. Habas, A. Köck, D. Pogany, E. Gornik: "Backside-laser probing of transient heating in power VDMOSFET´s"; Talk: International Conference on Physics of Semiconductor (ICPS), Berlin; 1996-07-21 in "Proc. ISPS ´96", (1996), 115 - 122. BibTeX |
10. | D. Pogany, T. Lalinsky, N. Seliger, J. Kuzmik, P. Habas, P. Hrkut, E. Gornik: "Power sensor microsystems characterization using a contactless optical laser method"; Talk: International Conference on Advanced Semiconductor Devices and Microsystems (ASDAM), Boston; 1996-07-01 in "Proc. of ASDAM ´96", (1996), 201 - 204. BibTeX |
9. | P. Habas: "Physics and Modeling in Concerning Hot-Carrier Degradation in MOSFETs"; Talk: Conference on Microelectronics and Optoelectronics, Nis; (invited) 1993-10-26 - 1993-10-28; in "Proceedings Conference on Microelectronics and Optoelectronics", (1993), 179 - 188. BibTeX |
8. | P. Habas, O. Heinreichsberger, S. Selberherr: "Analysis of the Degradation of n-channel LDD MOSFETs by Numerical Simulation of the Carge-Pumping Experiment"; Talk: International Conference on Solid State and Integrated Circuit Technology (ICSICT), Peking; 1992-10-18 - 1992-10-24; in "Proceedings Solid State and Integrated Circuit Technology 92 Conference", (1992), 691 - 693. BibTeX |
7. | P. Grubmair, P. Habas, O. Heinreichsberger, H. Kosina, C. Sala, S. Selberherr: "Recent Advances in Device Simulation at the TU-Vienna"; Talk: International Semiconductor Conference (CAS), Sinaia; (invited) 1992-10-06 - 1992-10-11; in "Proceedings CAS 92 Conference", (1992), 347 - 358. BibTeX |
6. | P. Habas, O. Heinreichsberger, S. Selberherr: "Transient Two-Dimensional Numerical Analysis of the Charge-Pumping Experiment"; Talk: European Solid-State Device Research Conference (ESSDERC), Leuven; 1992-09-14 - 1992-09-17; in "Proceedings of the European Solid-State Device Research Conference (ESSDERC)", (1992), ISBN: 0-444-89478-0, 687 - 690 doi:10.1016/0167-9317(92)90522-S. BibTeX |
5. | O. Heinreichsberger, P. Habas, S. Selberherr: "Analysis of Geometric Charge-Pumping Components in a Thin-Film SOI Device"; Talk: European Solid-State Device Research Conference (ESSDERC), Leuven; 1992-09-14 - 1992-09-17; in "Proceedings of the European Solid-State Device Research Conference (ESSDERC)", (1992), ISBN: 0-444-89478-0, 819 - 822 doi:10.1016/0167-9317(92)90552-3. BibTeX |
4. | P. Habas, S. Selberherr: "A Closed-Loop Extraction of the Spatial Distribution of Interface Traps Based on Numerical Model of the Charge-Pumping Experiment"; Poster: Solid State Devices and Materials Conference (SSDM), Tsukuba; 1992-08-26 - 1992-08-28; in "Proceedings SSDM 92 Conference", (1992), 170 - 172. BibTeX |
3. | P. Habas, A. Lugbauer, S. Selberherr: "Two-Dimensional Numerical Modeling of Interband Tunneling Accounting for Nonuniform Electric Field"; Talk: International Workshop on Numerical Modeling of Processes and Devices for Integrated Circuits (NUPAD), Seattle; 1992-05-31 - 1992-06-01; in "Proceedings NUPAD IV", (1992), ISBN: 0-7803-0516-7, 135 - 140. BibTeX |
2. | P. Habas, S. Selberherr: "Numerical Simulation of MOS-Devices with Non-Degenerate Gate"; Talk: European Solid-State Device Research Conference (ESSDERC), Nottingham; 1990-09-10 - 1990-09-13; in "Proceedings of the European Solid-State Device Research Conference (ESSDERC)", (1990), ISBN: 0-7503-0065-5, 161 - 164. BibTeX |
1. | O. Heinreichsberger, P. Habas, P. Lindorfer, G. Mayer, S. Selberherr, M. Stiftinger: "Neuere Entwicklungen bei MINIMOS"; Talk: Workshop Numerische Simulation für Technologieentwicklung (NuTech), Bad Tölz; 1989-08-02 - 1989-08-03; in "Proceedings NuTech 89", (1989), 7. BibTeX |
1. | P. Habas: "The Application of Charge-Pumping Technique to Characterize the Si/Si02 Interface in Power VDMOSFETs"; Talk: International Conference on Insulating Films on Semiconductors (INFOS), Villard-de-Lans; 1995-06-07 - 1995-06-10; . BibTeX |
1. | P. Habas: "Analysis of Physical Effects in Small Silicon MOS Devices"; Reviewer: S. Selberherr, E. Gornik; Institut für Mikroelektronik, 1993, oral examination: 1993-11-17. BibTeX |