Staff Person Publications

Publications Stefan Holzer

49 records

Publications in Scientific Journals

7.		Karner, M., Gehring, A., Holzer, S., Pourfath, M., Wagner, M., Goes, W., Vasicek, M., Baumgartner, O., Kernstock, C., Schnass, K., Zeiler, G., Grasser, T., Kosina, H., Selberherr, S. (2007). A Multi-Purpose Schrödinger-Poisson Solver for TCAD Applications. Journal of Computational Electronics, 6(1–3), 179–182. https://doi.org/10.1007/s10825-006-0077-7 (reposiTUm)

6.		Holzer, S., Sheikholeslami, A., Karner, M., Grasser, T., Selberherr, S. (2007). Comparison of Deposition Models for a TEOS LPCVD Process. Microelectronics Reliability, 47(4–5), 623–625. https://doi.org/10.1016/j.microrel.2007.01.058 (reposiTUm)

5.		Wagner, M., Karner, M., Cervenka, J., Vasicek, M., Kosina, H., Holzer, S., Grasser, T. (2007). Quantum Correction for DG MOSFETs. Journal of Computational Electronics, 5(4), 397–400. https://doi.org/10.1007/s10825-006-0032-7 (reposiTUm)

4.		Wagner, M., Span, G., Holzer, S., Grasser, T. (2007). Thermoelectric Power Generation Using Large-Area Si/SiGe Pn-Junctions With Varying Ge Content. Semiconductor Science and Technology, 22, 173–176. (reposiTUm)

3.		Karner, M., Gehring, A., Wagner, M., Entner, R., Holzer, S., Goes, W., Vasicek, M., Grasser, T., Kosina, H., Selberherr, S. (2007). VSP - A Gate Stack Analyzer. Microelectronics Reliability, 47(4–5), 704–708. https://doi.org/10.1016/j.microrel.2007.01.059 (reposiTUm)

2.		Meller, G., Li, L., Holzer, S., Kosina, H. (2006). Simulation of Carrier Injection and Propagation in Molecularly Disordered Systems. Optical and Quantum Electronics, 38(12–14), 993–1004. https://doi.org/10.1007/s11082-006-9051-7 (reposiTUm)

1.		S. Holzer, R. Minixhofer, C. Heitzinger, J. Fellner, T. Grasser, S. Selberherr: "Extraction of Material Parameters Based on Inverse Modeling of Three-Dimensional Interconnect Fusing Structures"; Microelectronics Journal, 35 (2004), 10; 805 - 810. https://doi.org/10.1016/j.mejo.2004.06.011

Contributions to Books

3.		Karner, M., Gehring, A., Holzer, S., Kosina, H., Selberherr, S. (2006). Efficient Calculation of Lifetime Based Direct Tunneling Through Stacked Dielectrics. In S. Kar, S. De Gendt, M. Houssa, D. Landheer, D. Misra, W. Tsai (Eds.), ECS Transactions (pp. 693–703). ECS Transactions. https://doi.org/10.1149/1.2209316 (reposiTUm)

2.		Karner, M., Holzer, S., Gös, W., Vasicek, M., Wagner, M., Kosina, H., Selberherr, S. (2006). Numerical Analysis of Gate Stacks. In S. Kar, S. De Gendt, M. Houssa, H. Iwai, D. Landheer, D. Misra (Eds.), ECS Transactions (pp. 299–308). ECS Transactions. https://doi.org/10.1149/1.2355721 (reposiTUm)

1.		Wagner, M., Span, G., Holzer, S., Palankovski, V., Triebl, O., Grasser, T. (2006). Power Output Improvement of Silicon-Germanium Thermoelectric Generators. In ECS Transactions (pp. 1151–1162). ECS Transactions. https://doi.org/10.1149/1.2355909 (reposiTUm)

Talks and Poster Presentations (with Proceedings-Entry)

31.		Baumgartner, O., Karner, M., Holzer, S., Pourfath, M., Grasser, T., Kosina, H. (2007). Adaptive Energy Integration of Non-Equilibrium Green's Functions. In NSTI Nanotech Proceedings (pp. 145–148), Anaheim, Austria. (reposiTUm)

30.		Meller, G., Li, L., Holzer, S., Kosina, H. (2007). Dynamic Monte Carlo Simulation of an Amorphous Organic Device. In Simulation of Semiconductor Processes and Devices 2007 (pp. 373–376), Vienna, Austria. https://doi.org/10.1007/978-3-211-72861-1_90 (reposiTUm)

29.		Holzer, S., Wagner, M., Friembichler, L., Langer, E., Grasser, T., Selberherr, S. (2006). A Multi-Purpose Optimization Framework for TCAD Applications. In ICCAM 2006 Abstracts of Talks (p. 76), Leuven. (reposiTUm)

28.		Holzer, S., Wagner, M., Sheikholeslami, A., Karner, M., Span, G., Grasser, T., Selberherr, S. (2006). An Extendable Multi-Purpose Simulation and Optimization Framework for Thermal Problems in TCAD Applications. In Collection of Papers Presented at the 12^th International Workshop on Thermal Investigation of ICs and Systems (pp. 239–244), Nice. (reposiTUm)

27.		Sheikholeslami, A., Heinzl, R., Holzer, S., Heitzinger, C., Spevak, M., Leicht, M., Häberlen, O., Fugger, J., Badrieh, F., Parhami, F., Puchner, H., Grasser, T., Selberherr, S. (2006). Applications of Two- And Three-Dimensional General Topography Simulator in Semiconductor Manufacturing Processes. In Proceedings of the 14^th Iranian Conference on Electrical Engineering ICEE 2006 (p. 4), Tehran. (reposiTUm)

26.		Holzer, S., Sheikholeslami, A., Karner, M., Grasser, T. (2006). Comparison of Deposition Models for TEOS CVD Process. In WODIM 2006 14^th Workshop on Dielectrics in Microelectronics Workshop Programme and Abstracts (pp. 158–159), Catania. (reposiTUm)

25.		Karner, M., Gehring, A., Holzer, S., Wagner, M., Kosina, H. (2006). Continuum Versus Quasi-Bound State Tunneling in Novel Device Architectures. In Abstracts IEEE 2006 Silicon Nanoelectronics Workshop (pp. 161–162), Honolulu. (reposiTUm)

24.		Wagner, M., Span, G., Holzer, S., Grasser, T. (2006). Design Optimization of Large Area Si/SiGe Thermoelectric Generators. In 2006 International Conference on Simulation of Semiconductor Processes and Devices, Monterey, California, United States. https://doi.org/10.1109/sispad.2006.282918 (reposiTUm)

23.		Karner, M., Gehring, A., Holzer, S., Kosina, H. (2006). Efficient Calculation of Quasi-Bound States for the Simulation of Direct Tunneling. In Large-Scale Scientific Computing: 5th International Conference, LSSC 2005 (pp. 572–577), Sozopol, Bulgaria. https://doi.org/10.1007/11666806_65 (reposiTUm)

22.		Meller, G., Li, L., Holzer, S., Kosina, H. (2006). Electron Kinetics in Disordered Organic Semiconductors. In Abstracts 2^nd Annual Organic Microelectronics Workshop (p. 42), Toronto. (reposiTUm)

21.		Karner, M., Holzer, S., Vasicek, M., Gös, W., Wagner, M., Kosina, H., Selberherr, S. (2006). Numerical Analysis of Gate Stacks. In 210^th ECS Meeting (p. 1), Cancun. (reposiTUm)

20.		S. Holzer, S. Selberherr: "Optimization Issue in Interconnect Analysis"; Talk: International Conference on Microelectronics (MIEL), Beograd (invited); 2006-05-14 - 2006-05-17; in: "Proceedings of the International Conference on Microelectronics (MIEL)", (2006), ISBN: 1-4244-0116-x; 465 - 470. https://doi.org/10.1109/ICMEL.2006.1650994

19.		Wagner, M., Span, G., Holzer, S., Triebl, O., Grasser, T. (2006). Power Output Improvement of SiGe Thermoelectric Generators. In Meeting Abstracts 2006 Joint International Meeting (p. 1), Honolulu, Austria. (reposiTUm)

18.		Meller, G., Li, L., Holzer, S., Kosina, H. (2006). Simulation of Carrier Injection and Propagation in Molecularly Disordered Systems. In Proceedings of the 6^th International Conference on Numerical Simulation of Optoelectronic Devices (pp. 1–2), Singapore. (reposiTUm)

17.		Karner, M., Ungersboeck, E., Gehring, A., Holzer, S., Kosina, H., Selberherr, S. (2006). Strain Effects on Quasi-Bound State Tunneling in Advanced SOI CMOS Technologies. In 2006 International Conference on Simulation of Semiconductor Processes and Devices, Monterey, California, United States. https://doi.org/10.1109/sispad.2006.282898 (reposiTUm)

16.		Span, G., Wagner, M., Holzer, S., Grasser, T. (2006). Thermoelectric Power Conversion Using Generation of Electron-Hole Pairs in Large Area P-N Junctions. In International Conference on Thermoelectrics (pp. 23–28), Vienna, Austria. (reposiTUm)

15.		Holzer, S., Hollauer, C., Ceric, H., Karner, M., Grasser, T., Langer, E., Selberherr, S. (2006). Three-Dimensional Transient Interconnect Analysis With Regard to Mechanical Stress. In Proceedings 13^th International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) (pp. 154–157), Singapore. (reposiTUm)

14.		M. Karner, A. Gehring, S. Holzer, M. Pourfath, M. Wagner, H. Kosina, T. Grasser, S. Selberherr: "VSP - A Multi-Purpose Schrödinger-Poisson Solver for TCAD Applications"; Poster: International Workshop on Computational Electronics (IWCE), Vienna, Austria; 2006-05-25 - 2006-05-27; in: "Book of Abstracts of the International Workshop on Computational Electronics (IWCE)", (2006), ISBN: 3-901578-16-1; 255 - 256.

13.		Karner, M., Gehring, A., Wagner, M., Entner, R., Holzer, S., Gös, W., Vasicek, M., Grasser, T., Kosina, H., Selberherr, S. (2006). VSP-A Gate Stack Analyzer. In WODIM 2006 14^th Workshop on Dielectrics in Microelectronics Workshop Program and Abstracts (pp. 101–102), Catania. (reposiTUm)

12.		Ceric, H., Deshpande, V., Hollauer, C., Holzer, S., Grasser, T., Selberherr, S. (2005). Comprehensive Analysis of Vacancy Dynamics Due to Electromigration. In Proceedings of the 12^th International Symposium on the Physical, Failure Analysis of Integrated Circuits (pp. 100–103), Singapore. (reposiTUm)

11.		Karner, M., Gehring, A., Holzer, S., Kosina, H., Selberherr, S. (2005). Efficient Calculation of Quasi-Bound State Tunneling Through Stacked Dielectrics. In 208^th ECS Meeting (p. 1), Honolulu, Austria. (reposiTUm)

10.		Sheikholeslami, A., Holzer, S., Heitzinger, C., Leicht, M., Häberlen, O., Fugger, J., Grasser, T., Selberherr, S. (2005). Inverse Modeling of Oxid Deposition Using Measurements of a TEOS CVD Process. In 2005 PhD Research in Microelectronics and Electronics (pp. 279–282), Lausanne, Austria. (reposiTUm)

9.		Hollauer, C., Holzer, S., Ceric, H., Wagner, S., Grasser, T., Selberherr, S. (2005). Investigation of Thermo-Mechanical Stress in Modern Interconnect Layouts. In Proceedings of The Sixth International Congress on Thermal Stresses (pp. 637–640), Wien, Austria. (reposiTUm)

8.		Holzer, S., Selberherr, S. (2005). Material Parameter Identification for Interconnect Analysis. In Proceedings of the XIII International Workshop on Physics of Semiconductor Devices (pp. 635–641), New Dehli. (reposiTUm)

7.		Karner, M., Gehring, A., Holzer, S., Kosina, H. (2005). On the Efficient Calculation of Quasi-Bound States for the Simulation of Direct Tunneling. In Proceedings of the International Conference on Large-Scale Scientific Computations (LSSC) (pp. 33–34), Sozopol, Bulgaria. (reposiTUm)

6.		Holzer, S., Hollauer, C., Ceric, H., Wagner, S., Entner, R., Langer, E., Grasser, T., Selberherr, S. (2005). Three-Dimensional Transient Electro-Thermal Interconnect Simulation for Stress and Electromigration Analysis. In NSTI Nanotech Technical Proceedings (pp. 620–623), Anaheim, Austria. (reposiTUm)

5.		Holzer, S., Hollauer, C., Ceric, H., Wagner, S., Langer, E., Grasser, T., Selberherr, S. (2005). Transient Electro-Thermal Investigations of Interconnect Structures Exposed to Mechanical Stress. In VLSI Circuits and Systems II (pp. 380–387), Sevilla, Spain. https://doi.org/10.1117/12.608414 (reposiTUm)

4.		S. Holzer, A. Sheikholeslami, S. Wagner, C. Heitzinger, T. Grasser, S. Selberherr: "Optimization and Inverse Modeling for TCAD Applications"; Talk: Symposium on Nano Device Technology (SNDT), Hsinchu; 2004-05-12 - 2004-05-13; in: "Proceedings of the Symposium on Nano Device Technology", (2004), 113 - 116.

3.		H. Ceric, R. Sabelka, S. Holzer, W. Wessner, S. Wagner, T. Grasser, S. Selberherr: "The Evolution of the Resistance and Current Density During Electromigration"; Poster: International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), Munich, Germany; 2004-09-02 - 2004-09-04; in: "Proceedings of the International Conference on Simulation of Semiconductor Processes and Devices (SISPAD)", Springer, (2004), ISBN: 3211224688; 331 - 334. https://doi.org/10.1007/978-3-7091-0624-2_78

2.		S. Holzer, R. Minixhofer, C. Heitzinger, J. Fellner, T. Grasser, S. Selberherr: "Extraction of Material Parameters Based on Inverse Modeling of Three-Dimensional Interconnect Structures"; Talk: Workshop on Thermal Investigations of ICs and Systems (THERMINIC), Aix-en-Provence; 2003-09-24 - 2003-09-26; in: "International Workshop on Thermal Investigations of ICs and Systems", (2003), ISBN: 2-848-130202; 263 - 268.

1.		R. Minixhofer, S. Holzer, C. Heitzinger, J. Fellner, T. Grasser, S. Selberherr: "Optimization of Electrothermal Material Parameters Using Inverse Modeling"; Talk: European Solid-State Device Research Conference (ESSDERC), Estoril; 2003-09-16 - 2003-09-18; in: "Proceedings of the European Solid-State Device Research Conference (ESSDERC)", (2003), ISBN: 0-7803-7999-3; 363 - 366.

Talks and Poster Presentations (without Proceedings-Entry)

1.		Holzer, S., Hollauer, C., Ceric, H., Wagner, S., Langer, E., Grasser, T., Selberherr, S. (2005). Transient Electro-Thermal Investigations of Interconnect Structures Exposed to Mechanical Stress. SPIE VLSI Circuits and Systems, Sevilla, Spain, Austria. (reposiTUm)

Doctor's Theses (authored and supervised)

1.		Holzer, S. (2007). Optimization for Enhanced Thermal Technology CAD Purposes Technische Universität Wien. https://doi.org/10.34726/hss.2007.8993 (reposiTUm)

Diploma and Master Theses (authored and supervised)

4.		L. Friembichler: "Design and Implementation of a Generic Optimizer"; Supervisor: E. Langer, S. Holzer; Institut für Mikroelektronik, 2006; final examination: 2006-04-27.

3.		S. Holzer: "Implementation of a Platform Independent "Queue Manager" for the Optimization Framework SIESTA"; Supervisor: S. Selberherr, R. Klima; Institut für Mikroelektronik, 2002.

2.		S. Holzer: "Simulationssoftware für Hiperlan Typ 1"; Supervisor: M. Hagenauer; E 389, 1999.

1.		S. Holzer: "Telearbeit und ihr Einfluß auf die Regionalentwicklung - dargestellt am Beispiel der Region "Inneres Salzkammergut""; Supervisor: W. Feilmayr, M. Schrenk; Institut für Stadt und Regionalforschung, 1998.

Scientific Reports

2.		Grasser, T., Gös, W., Triebl, O., Hehenberger, P. P., Wagner, P.-J., Schwaha, P., Heinzl, R., Holzer, S., Entner, R., Wagner, S., Schanovsky, F. (2007). 3 Year Report 2005-2007. (reposiTUm)

1.		Ceric, H., Holzer, S., Sheikholeslami, A., Ayalew, T., Wittmann, R., Selberherr, S. (2004). VISTA Status Report June 2004. (reposiTUm)