Publications Stefan Holzer
49 records
8. | S. Holzer, A. Sheikholeslami, M. Karner, T. Grasser, S. Selberherr: "Comparison of Deposition Models for a TEOS LPCVD Process"; Microelectronics Reliability, 47, (2007), 623 - 625 doi:10.1016/j.microrel.2007.01.058. BibTeX |
7. | M. Karner, A. Gehring, S. Holzer, M. Pourfath, M. Wagner, W. Gös, M. Vasicek, O. Baumgartner, Ch. Kernstock, K. Schnass, G. Zeiler, T. Grasser, H. Kosina, S. Selberherr: "A Multi-Purpose Schrödinger-Poisson Solver for TCAD Applications"; Journal of Computational Electronics, 6, (2007), 179 - 182 doi:10.1007/s10825-006-0077-7. BibTeX |
6. | M. Karner, A. Gehring, M. Wagner, R. Entner, S. Holzer, W. Gös, M. Vasicek, T. Grasser, H. Kosina, S. Selberherr: "VSP - A Gate Stack Analyzer"; Microelectronics Reliability, 47, (2007), 704 - 708 doi:10.1016/j.microrel.2007.01.059. BibTeX |
5. | M. Wagner, M. Karner, J. Cervenka, M. Vasicek, H. Kosina, S. Holzer, T. Grasser: "Quantum Correction for DG MOSFETs"; Journal of Computational Electronics, 5, (2007), 397 - 400 doi:10.1007/s10825-006-0032-7. BibTeX |
4. | M. Wagner, G. Span, S. Holzer, T. Grasser: "Thermoelectric Power Generation Using Large-Area Si/SiGe pn-Junctions with Varying Ge Content"; Semiconductor Science and Technology, 22, (2007), 173 - 176. BibTeX |
3. | G. Meller, L. Li, S. Holzer, H. Kosina: "Simulation of Carrier Injection and Propagation in Molecularly Disordered Systems"; Optical and Quantum Electronics, 38, (2006), 993 - 1004 doi:10.1007/s11082-006-9051-7. BibTeX |
2. | S. Holzer, Ch. Hollauer, H. Ceric, S. Wagner, E. Langer, T. Grasser, S. Selberherr: "Transient Electro-Thermal Investigations of Interconnect Structures Exposed to Mechanical Stress"; Proceedings of SPIE, 5837, (2005), 380 - 387 doi:10.1117/12.608414. BibTeX |
1. | S. Holzer, R. Minixhofer, C. Heitzinger, J. Fellner, T. Grasser, S. Selberherr: "Extraction of Material Parameters Based on Inverse Modeling of Three-Dimensional Interconnect Fusing Structures"; Microelectronics Journal, 35, (2004), 805 - 810 doi:10.1016/j.mejo.2004.06.011. BibTeX |
4. | M. Karner, A. Gehring, S. Holzer, H. Kosina: "Efficient Calculation of Quasi-bound States for the Simulation of Direct Tunneling"; in "Large-Scale Scientific Computing, Lecture Notes in Computer Science", 3743, I. Lirkov, S. Margenov, J. Wasniewski (ed); Springer Berlin Heidelberg, 2006, ISBN: 3-540-31994-8, 572 - 577 doi:10.1007/11666806_65. BibTeX |
3. | M. Karner, A. Gehring, S. Holzer, H. Kosina, S. Selberherr: "Efficient Calculation of Lifetime Based Direct Tunneling Through Stacked Dielectrics"; in "Physics and Technology of High-k Gate Dielectrics III, Vol. 1 No. 5", issued by The Electrochemical Society; S. Kar, S. De Gendt, M. Houssa, D. Landheer, D. Misra, W. Tsai (ed); ECS Transactions, 2006, ISBN: 1-56677-444-6, 693 - 703 doi:10.1149/1.2209316. BibTeX |
2. | M. Karner, S. Holzer, W. Gös, M. Vasicek, M. Wagner, H. Kosina, S. Selberherr: "Numerical Analysis of Gate Stacks"; in "Physics and Technology of High-k Gate Dielectrics 4, Vol. 3 No. 3", issued by The Electrochemical Society; S. Kar, S. De Gendt, M. Houssa, H. Iwai, D. Landheer, D. Misra (ed); ECS Transactions, 2006, ISBN: 1-56677-503-5, 299 - 308 doi:10.1149/1.2355721. BibTeX |
1. | M. Wagner, G. Span, S. Holzer, V. Palankovski, O. Triebl, T. Grasser: "Power Output Improvement of Silicon-Germanium Thermoelectric Generators"; in "SiGe and Ge: Materials, Processing, and Devices, Vol. 3, No. 7", issued by The Electrochemical Society; ECS Transactions, 2006, ISBN: 1-56677-507-8, 1151 - 1162 doi:10.1149/1.2355909. BibTeX |
29. | G. Meller, L. Li, S. Holzer, H. Kosina: "Dynamic Monte Carlo Simulation of an Amorphous Organic Device"; Poster: T. Grasser, S. Selberherr (ed); International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), Vienna, Austria; 2007-09-25 - 2007-09-27; in "Proceedings of the International Conference on Simulation of Semiconductor Processes and Devices (SISPAD)", (2007), 12, ISBN: 978-3-211-72860-4, 373 - 376 doi:10.1007/978-3-211-72861-1_90. BibTeX |
28. | O. Baumgartner, M. Karner, S. Holzer, M. Pourfath, T. Grasser, H. Kosina: "Adaptive Energy Integration of Non-Equilibrium Green´s Functions"; Poster: The Nanotechnology Conference and Trade Show, Santa Clara; 2007-05-19 - 2007-05-24; in "NSTI Nanotech Proceedings", (2007), 3, ISBN: 1-4200-6184-4, 145 - 148. BibTeX |
27. | M. Karner, S. Holzer, M. Vasicek, W. Gös, M. Wagner, H. Kosina, S. Selberherr: "Numerical Analysis of Gate Stacks"; Talk: Meeting of the Electrochemical Society, High Dielectric Constant Gate Stacks, Cancun; 2006-10-29 - 2006-11-03; in "210th ECS Meeting", (2006), ISSN: 1091-8213, 1 page(s) . BibTeX |
26. | M. Wagner, G. Span, S. Holzer, O. Triebl, T. Grasser: "Power Output Improvement of SiGe Thermoelectric Generators"; Talk: Meeting of the Electrochemical Society (ECS), Cancun; 2006-10-29 - 2006-11-03; in "Meeting Abstracts 2006 Joint International Meeting", (2006), ISSN: 1091-8213, 1 page(s) . BibTeX |
25. | S. Holzer, M. Wagner, A. Sheikholeslami, M. Karner, G. Span, T. Grasser, S. Selberherr: "An Extendable Multi-Purpose Simulation and Optimization Framework for Thermal Problems in TCAD Applications"; Talk: Workshop on Thermal Investigations of ICs and Systems (THERMINIC), Nice; 2006-09-27 - 2006-09-29; in "Collection of Papers Presented at the 12th International Workshop on Thermal Investigation of ICs and Systems", (2006), ISBN: 2-9161-8704-9, 239 - 244. BibTeX |
24. | G. Meller, L. Li, S. Holzer, H. Kosina: "Simulation of Carrier Injection and Propagation in Molecularly Disordered Systems"; Talk: Numerical Simulation of Optoelectronic Devices (NUSOD), Singapore; 2006-09-11 - 2006-09-14; in "Proceedings of the 6th International Conference on Numerical Simulation of Optoelectronic Devices", (2006), ISBN: 0-7803-9755-x, 1 - 2. BibTeX |
23. | M. Karner, E. Ungersböck, A. Gehring, S. Holzer, H. Kosina, S. Selberherr: "Strain Effects on Quasi-Bound State Tunneling in Advanced SOI CMOS Technologies"; Talk: International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), Monterey, CA, USA; 2006-09-06 - 2006-09-08; in "Proceedings of the International Conference on Simulation of Semiconductor Processes and Devices (SISPAD)", (2006), ISBN: 1-4244-0404-5, 314 - 317 doi:10.1109/SISPAD.2006.282898. BibTeX |
22. | M. Wagner, G. Span, S. Holzer, T. Grasser: "Design Optimization of Large Area Si/SiGe Thermoelectric Generators"; Talk: International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), Monterey, CA, USA; 2006-09-06 - 2006-09-08; in "Proceedings of the International Conference on Simulation of Semiconductor Processes and Devices (SISPAD)", (2006), ISBN: 1-4244-0404-5, 397 - 400 doi:10.1109/SISPAD.2006.282918. BibTeX |
21. | G. Span, M. Wagner, S. Holzer, T. Grasser: "Thermoelectric Power Conversion using Generation of Electron-Hole Pairs in Large Area p-n Junctions"; Talk: International Conference on Thermoelectrics, Vienna; 2006-08-06 - 2006-08-10; in "International Conference on Thermoelectrics", (2006), 6, ISBN: 1-4244-0811-3, 23 - 28. BibTeX |
20. | S. Holzer, M. Wagner, L. Friembichler, E. Langer, T. Grasser, S. Selberherr: "A Multi-Purpose Optimization Framework for TCAD Applications"; Talk: International Congress on Computational and Applied Mathematics (ICCAM), Leuven; 2006-07-10 - 2006-07-14; in "ICCAM 2006 Abstracts of Talks", (2006), 76. BibTeX |
19. | G. Meller, L. Li, S. Holzer, H. Kosina: "Electron Kinetics in Disordered Organic Semiconductors"; Poster: ACS/IEEE/MRS Annual Organic Microelectronics Workshop, Toronto; 2006-07-09 - 2006-07-12; in "Abstracts 2nd Annual Organic Microelectronics Workshop", (2006), 42. BibTeX |
18. | S. Holzer, Ch. Hollauer, H. Ceric, M. Karner, T. Grasser, E. Langer, S. Selberherr: "Three-Dimensional Transient Interconnect Analysis With Regard to Mechanical Stress"; Poster: IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA), Singapore; 2006-07-03 - 2006-07-07; in "Proceedings 13th International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA)", (2006), ISBN: 1-4244-0206-9, 154 - 157. BibTeX |
17. | S. Holzer, A. Sheikholeslami, M. Karner, T. Grasser: "Comparison of Deposition Models for TEOS CVD Process"; Talk: Workshop on Dielectrics in Microelectronics (WODIM), Catania; 2006-06-26 - 2006-06-28; in "WODIM 2006 14th Workshop on Dielectrics in Microelectronics Workshop Programme and Abstracts", (2006), 158 - 159. BibTeX |
16. | M. Karner, A. Gehring, M. Wagner, R. Entner, S. Holzer, W. Gös, M. Vasicek, T. Grasser, H. Kosina, S. Selberherr: "VSP-A Gate Stack Analyzer"; Talk: Workshop on Dielectrics in Microelectronics (WODIM), Catania; 2006-06-26 - 2006-06-28; in "WODIM 2006 14th Workshop on Dielectrics in Microelectronics Workshop Program and Abstracts", (2006), 101 - 102. BibTeX |
15. | M. Karner, A. Gehring, S. Holzer, M. Wagner, H. Kosina: "Continuum Versus Quasi-Bound State Tunneling in Novel Device Architectures"; Poster: Silicon Nanoelectronics Workshop, Honolulu; 2006-06-11 - 2006-06-12; in "Abstracts IEEE 2006 Silicon Nanoelectronics Workshop", (2006), 161 - 162. BibTeX |
14. | M. Karner, A. Gehring, S. Holzer, M. Pourfath, M. Wagner, H. Kosina, T. Grasser, S. Selberherr: "VSP - A Multi-Purpose Schrödinger-Poisson Solver for TCAD Applications"; Poster: International Workshop on Computational Electronics (IWCE), Vienna, Austria; 2006-05-25 - 2006-05-27; in "Book of Abstracts of the International Workshop on Computational Electronics (IWCE)", (2006), ISBN: 3-901578-16-1, 255 - 256. BibTeX |
13. | A. Sheikholeslami, R. Heinzl, S. Holzer, C. Heitzinger, M. Spevak, M. Leicht, O. Häberlen, J. Fugger, F. Badrieh, F. Parhami, H. Puchner, T. Grasser, S. Selberherr: "Applications of Two- and Three-Dimensional General Topography Simulator in Semiconductor Manufacturing Processes"; Talk: Iranian Conference on Electrical Engineering (ICEE), Tehran; 2006-05-16 - 2006-05-18; in "Proceedings of the 14th Iranian Conference on Electrical Engineering ICEE 2006", (2006), 4 page(s) . BibTeX |
12. | S. Holzer, S. Selberherr: "Optimization Issue in Interconnect Analysis"; Talk: International Conference on Microelectronics (MIEL), Beograd; (invited) 2006-05-14 - 2006-05-17; in "Proceedings of the International Conference on Microelectronics (MIEL)", (2006), ISBN: 1-4244-0116-x, 465 - 470 doi:10.1109/ICMEL.2006.1650994. BibTeX |
11. | S. Holzer, S. Selberherr: "Material Parameter Identification for Interconnect Analysis"; Talk: International Workshop on the Physics of Semiconductor Devices (IWPSD), New Dehli; (invited) 2005-12-13 - 2005-12-17; in "Proceedings of the XIII International Workshop on Physics of Semiconductor Devices", (2005), Vol. 2, ISBN: 81-7764-946-9, 635 - 641. BibTeX |
10. | M. Karner, A. Gehring, S. Holzer, H. Kosina, S. Selberherr: "Efficient Calculation of Quasi-Bound State Tunneling through Stacked Dielectrics"; Talk: Meeting of the Electrochemical Society (ECS), Los Angeles; 2005-10-16 - 2005-10-21; in "208th ECS Meeting", (2005), 1119, ISSN: 1091-8213, 1 page(s) . BibTeX |
9. | A. Sheikholeslami, S. Holzer, C. Heitzinger, M. Leicht, O. Häberlen, J. Fugger, T. Grasser, S. Selberherr: "Inverse Modeling of Oxid Deposition Using Measurements of a TEOS CVD Process"; Talk: PhD Research in Microelectronics and Electronics (PRIME), Lausanne; 2005-07-25 - 2005-07-28; in "2005 PhD Research in Microelectronics and Electronics", (2005), Vol. 2, ISBN: 0-7803-9345-7, 279 - 282. BibTeX |
8. | H. Ceric, V. Deshpande, Ch. Hollauer, S. Holzer, T. Grasser, S. Selberherr: "Comprehensive Analysis of Vacancy Dynamics Due to Electromigration"; Talk: IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA), Singapore; 2005-06-27 - 2005-07-01; in "Proceedings of the 12th International Symposium on the Physical & Failure Analysis of Integrated Circuits", (2005), ISBN: 0-7803-9301-5, 100 - 103. BibTeX |
7. | M. Karner, A. Gehring, S. Holzer, H. Kosina: "On the Efficient Calculation of Quasi-Bound States for the Simulation of Direct Tunneling"; Talk: International Conference on Large-Scale Scientific Computations (LSSC), Sozopol, Bulgaria; 2005-06-06 - 2005-06-10; in "Proceedings of the International Conference on Large-Scale Scientific Computations (LSSC)", (2005), 33 - 34. BibTeX |
6. | Ch. Hollauer, S. Holzer, H. Ceric, S. Wagner, T. Grasser, S. Selberherr: "Investigation of Thermo-Mechanical Stress in Modern Interconnect Layouts"; Talk: International Congress on Thermal Stresses (TS), Wien; 2005-05-26 - 2005-05-29; in "Proceedings of The Sixth International Congress on Thermal Stresses", (2005), Vol. 2, ISBN: 3-901167-12-9, 637 - 640. BibTeX |
5. | S. Holzer, Ch. Hollauer, H. Ceric, S. Wagner, R. Entner, E. Langer, T. Grasser, S. Selberherr: "Three-Dimensional Transient Electro-Thermal Interconnect Simulation for Stress and Electromigration Analysis"; Poster: The Nanotechnology Conference and Trade Show, Anaheim; 2005-05-08 - 2005-05-12; in "NSTI Nanotech Technical Proceedings", (2005), Vol. 3 (CDROM ISBN: 0-9767985-4-9), ISBN: 0-9767985-2-2, 620 - 623. BibTeX |
4. | H. Ceric, R. Sabelka, S. Holzer, W. Wessner, S. Wagner, T. Grasser, S. Selberherr: "The Evolution of the Resistance and Current Density During Electromigration"; Poster: International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), Munich, Germany; 2004-09-02 - 2004-09-04; in "Proceedings of the International Conference on Simulation of Semiconductor Processes and Devices (SISPAD)", (2004), ISBN: 3211224688, 331 - 334 doi:10.1007/978-3-7091-0624-2_78. BibTeX |
3. | S. Holzer, A. Sheikholeslami, S. Wagner, C. Heitzinger, T. Grasser, S. Selberherr: "Optimization and Inverse Modeling for TCAD Applications"; Talk: Symposium on Nano Device Technology (SNDT), Hsinchu; 2004-05-12 - 2004-05-13; in "Proceedings of the Symposium on Nano Device Technology", (2004), 113 - 116. BibTeX |
2. | S. Holzer, R. Minixhofer, C. Heitzinger, J. Fellner, T. Grasser, S. Selberherr: "Extraction of Material Parameters Based on Inverse Modeling of Three-Dimensional Interconnect Structures"; Talk: Workshop on Thermal Investigations of ICs and Systems (THERMINIC), Aix-en-Provence; 2003-09-24 - 2003-09-26; in "International Workshop on Thermal Investigations of ICs and Systems", (2003), ISBN: 2-848-130202, 263 - 268. BibTeX |
1. | R. Minixhofer, S. Holzer, C. Heitzinger, J. Fellner, T. Grasser, S. Selberherr: "Optimization of Electrothermal Material Parameters Using Inverse Modeling"; Talk: European Solid-State Device Research Conference (ESSDERC), Estoril; 2003-09-16 - 2003-09-18; in "Proceedings of the European Solid-State Device Research Conference (ESSDERC)", (2003), ISBN: 0-7803-7999-3, 363 - 366. BibTeX |
1. | S. Holzer, Ch. Hollauer, H. Ceric, S. Wagner, E. Langer, T. Grasser, S. Selberherr: "Transient Electro-Thermal Investigations of Interconnect Structures Exposed to Mechanical Stress"; Talk: SPIE VLSI Circuits and Systems, Sevilla, Spain; 2005-05-09 - 2005-05-11; . BibTeX |
1. | S. Holzer: "Optimization for Enhanced Thermal Technology CAD Purposes"; Reviewer: T. Grasser, H. Schichl; Institut für Mikroelektronik, 2007, oral examination: 2007-06-28 doi:10.34726/hss.2007.8993. BibTeX |
4. | L. Friembichler: "Design and Implementation of a Generic Optimizer"; Supervisor: E. Langer, S. Holzer; Institut für Mikroelektronik, 2006, final examination: 2006-04-27. BibTeX |
3. | S. Holzer: "Implementation of a Platform Independent "Queue Manager" for the Optimization Framework SIESTA"; Supervisor: S. Selberherr, R. Klima; Institut für Mikroelektronik, 2002, . BibTeX |
2. | S. Holzer: "Simulationssoftware für Hiperlan Typ 1"; Supervisor: M. Hagenauer; E 389, 1999, . BibTeX |
1. | S. Holzer: "Telearbeit und ihr Einfluß auf die Regionalentwicklung - dargestellt am Beispiel der Region "Inneres Salzkammergut""; Supervisor: W. Feilmayr, M. Schrenk; Institut für Stadt und Regionalforschung, 1998, . BibTeX |
2. | T. Grasser, W. Gös, O. Triebl, Ph. Hehenberger, P.-J. Wagner, P. Schwaha, R. Heinzl, S. Holzer, R. Entner, S. Wagner, F. Schanovsky: "3 Year Report 2005-2007"; (2007), 34 page(s) . BibTeX |
1. | H. Ceric, S. Holzer, A. Sheikholeslami, T. Ayalew, R. Wittmann, S. Selberherr: "VISTA Status Report June 2004"; (2004), 28 page(s) . BibTeX |