Publications Markus Kampl
11 records
| 1. | M. Kampl, H. Kosina: "The Backward Monte Carlo Method for Semiconductor Device Simulation"; Journal of Computational Electronics, 17, (2018), 1492 - 1504 doi:10.1007/s10825-018-1225-6. BibTeX |
| 6. | M. Kampl, H. Kosina, M. Waltl: "Improved Sampling Algorithms for Monte Carlo Device Simulation"; Talk: International Workshop on Computational Nanotechnology (IWCN), Daejeon, Korea (Virtual); 2021-05-24 - 2021-06-06; in "Book of Abstracts of the International Workshop on Computational Nanotechnology (IWCN)", (2021), ISBN: 978-89-89453-30-7, 53 - 54. BibTeX |
| 5. | H. Kosina, M. Kampl: "Current Estimation in Backward Monte Carlo Simulations"; Poster: International Workshop on Computational Nanotechnology (IWCN), Chicago, IL, USA; 2019-05-20 - 2019-05-24; in "Book of Abstracts of the International Workshop on Computational Nanotechnology (IWCN)", (2019), ISBN: 978-3-9504738-0-3, 129 - 130. BibTeX |
| 4. | H. Kosina, M. Kampl: "Effect of Electron-Electron Scattering on the Carrier Distribution in Semiconductor Devices"; Talk: International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), Austin, Texas, USA; 2018-09-24 - 2018-09-26; in "Proceedings of the International Conference on Simulation of Semiconductor Processes and Devices (SISPAD)", (2018), ISBN: 978-1-5386-6788-0, 18 - 21 doi:10.1109/SISPAD.2018.8551734. BibTeX |
| 3. | M. Kampl, H. Kosina, O. Baumgartner: "Hot Carrier Study Including e-e Scattering Based on a Backward Monte Carlo Method"; Talk: International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), Kamakura, Japan; 2017-09-07 - 2017-09-09; in "Proceedings of the International Conference on Simulation of Semiconductor Processes and Devices (SISPAD)", (2017), ISBN: 978-4-86348-612-6, 293 - 296 doi:10.23919/SISPAD.2017.8085322. BibTeX |
| 2. | M. Kampl, H. Kosina: "Investigation of Hot-Carrier Effects Using a Backward Monte Carlo Method and Full Bands"; Poster: International Workshop on Computational Nanotechnology (IWCN), Low Wood Bay, Lake District, UK; 2017-06-05 - 2017-06-09; in "Book of Abstracts of the International Workshop on Computational Nanotechnology (IWCN)", (2017), 147 - 148. BibTeX |
| 1. | R. Kosik, M. Kampl, H. Kosina: "On the Characteristic Neumann Equation and the Wigner Equation"; Talk: International Wigner Workshop (IW2), Low Wood Bay, Lake District, UK; 2017-06-05 in "Book of Abstracts of the International Wigner Workshop (IW2)", (2017), ISBN: 978-3-200-05129-4, 26 - 27. BibTeX |
| 2. | L. Filipovic, M. Kampl, T. Knobloch, G. Rzepa, J. Weinbub: "Ihr Smartphone - Ein Supercomputer vor 20 Jahren. Ein Einblick in die Mikro- und Nanoelektronik (mit Virtual Reality)"; Talk: Lange Nacht der Forschung 2018, Wien; 2018-04-13. BibTeX |
| 1. | B. Ullmann, A. Grill, P. Manstetten, M. Jech, M. Kampl, W. H. Zisser, L. Filipovic, M. Thesberg, F. Rudolf, T. Windbacher, J. Cervenka, M. Katterbauer, J. Weinbub: "Ihr Smartphone - ein Supercomputer vor 20 Jahren. Ein Einblick in die Mikro- und Nanoelektronik"; Talk: Lange Nacht der Forschung 2016, Wien; 2016-04-22. BibTeX |
| 1. | M. Kampl: "Investigating Hot-Carrier Effects using the Backward Monte Carlo Method"; Reviewer: H. Kosina, A. Garcia Loureiro, G. Hobler; Institut für Mikroelektronik, 2019, oral examination: 2019-04-05 doi:10.34726/hss.2019.65003. BibTeX |
| 1. | M. Kampl: "Implementation of a Backward Monte Carlo Algorithm to Investigate Hot Carriers in Semiconductor Devices"; Supervisor: H. Kosina, Z. Stanojevic; Institut für Mikroelektronik, 2015, final examination: 2015-11-20. BibTeX |