Publications Xaver Klemenschits
8 records
| 2. | A. Toifl, M. Quell, X. Klemenschits, P. Manstetten, A. Hössinger, S. Selberherr, J. Weinbub: "The Level-Set Method for Multi-Material Wet Etching and Non-Planar Selective Epitaxy"; IEEE Access, 8, (2020), 115406 - 115422 doi:10.1109/ACCESS.2020.3004136. BibTeX |
| 1. | X. Klemenschits, S. Selberherr, L. Filipovic: "Modeling of Gate Stack Patterning for Advanced Technology Nodes: A Review"; Micromachines, 9, (invited) (2018), 631-1 - 631-31 doi:10.3390/mi9120631. BibTeX |
| 2. | X. Klemenschits, S. Selberherr, L. Filipovic: "Modeling of Gate Stack Patterning for Advanced Technology Nodes: A Review"; in "Miniaturized Transistors", L. Filipovic, T. Grasser (ed); MDPI, (invited) 2019, ISBN: 978-3-03921-010-7, 105 - 135 doi:10.3390/books978-3-03921-011-4. BibTeX |
| 1. | X. Klemenschits, S. Selberherr, L. Filipovic: "Unified Feature Scale Model for Etching in SF6 and Cl Plasma Chemistries"; in "Proceedings of the 2018 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS)", F. Gamiz, V. Sverdlov, C. Sampedro, L. Donetti (ed); IEEE Xplore, 2018, ISBN: 978-1-5386-4812-4, 177 - 180 doi:10.1109/ULIS.2018.8354763. BibTeX |
| 4. | X. Klemenschits, S. Selberherr, L. Filipovic: "Geometric Advection Algorithm for Process Emulation"; Talk: International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), Kobe, Japan - virtual; 2020-09-23 - 2020-10-06; in "Proceedings of the International Conference on Simulation of Semiconductor Processes and Devices (SISPAD)", (2020), 59 - 62 doi:10.23919/SISPAD49475.2020.9241678. BibTeX |
| 3. | X. Klemenschits, P. Manstetten, L. Filipovic, S. Selberherr: "Process Simulation in the Browser: Porting ViennaTS using WebAssembly"; Talk: International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), Udine, Italy; 2019-09-04 - 2019-09-06; in "Proceedings of the International Conference on Simulation of Semiconductor Processes and Devices (SISPAD)", (2019), ISBN: 978-1-7281-0938-1, 339 - 342 doi:10.1109/SISPAD.2019.8870374. BibTeX |
| 2. | X. Klemenschits, S. Selberherr, L. Filipovic: "Fast Volume Evaluation on Sparse Level Sets"; Poster: International Workshop on Computational Nanotechnology (IWCN), Chicago, IL, USA; 2019-05-20 - 2019-05-24; in "Book of Abstracts of the International Workshop on Computational Nanotechnology (IWCN)", (2019), ISBN: 978-3-9504738-0-3, 113 - 114. BibTeX |
| 1. | X. Klemenschits, S. Selberherr, L. Filipovic: "Unified Feature Scale Model for Etching in SF6 and Cl Plasma Chemistries"; Poster: Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS), Granada, Spain; 2018-03-19 - 2018-03-21; in "Book of Abstracts of the Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS)", (2018), ISBN: 978-1-5386-4810-0, 65 - 66. BibTeX |