Publications Tobias Reiter
17 recordsPublications in Scientific Journals
7. | Reiter, T., Aguinsky, L. F., Souza Berti Rodrigues, F., Weinbub, J., Hössinger, A., Filipovic, L. (2024). Modeling the Impact of Incomplete Conformality During Atomic Layer Processing. Solid-State Electronics, 211, Article 108816. https://doi.org/10.1016/j.sse.2023.108816 (reposiTUm) | |
6. | Filipovic, L., Baumgartner, O., Klemenschits, X., Piso, J., Bobinac, J., Reiter, T., Strof, G., Rzepa, G., Stanojevic, Z., Karner, M. (2023). DTCO Flow for Air Spacer Generation and Its Impact on Power and Performance at N7. Solid-State Electronics, 199, Article 108527. https://doi.org/10.1016/j.sse.2022.108527 (reposiTUm) | |
5. | Bobinac, J., Reiter, T., Piso, J., Klemenschits, X., Baumgartner, O., Stanojevic, Z., Strof, G., Karner, M., Filipovic, L. (2023). Effect of Mask Geometry Variation on Plasma Etching Profiles. Micromachines, 14(3), Article 665. https://doi.org/10.3390/mi14030665 (reposiTUm) | |
4. | Aguinsky, L. F., Souza Berti Rodrigues, F., Reiter, T., Klemenschits, X., Filipovic, L., Hössinger, A., Weinbub, J. (2023). Modeling Incomplete Conformality During Atomic Layer Deposition in High Aspect Ratio Structures. Solid-State Electronics, 201, Article 108584. https://doi.org/10.1016/j.sse.2022.108584 (reposiTUm) | |
3. | Horodynski, M., Reiter, T., Kühmayer, M., Rotter, S. (2023). Tractor Beams With Optimal Pulling Force Using Structured Waves. Physical Review A, 108(2), Article 023504. https://doi.org/10.1103/PhysRevA.108.023504 (reposiTUm) | |
2. | Kersten, W. N., De Zordo, N., Diekmann, O., Reiter, T., Zens, M., Kanagin, A. N., Rotter, S., Schmiedmayer, H.-J., Angerer, A. (2023). Triggered Superradiance and Spin Inversion Storage in a Hybrid Quantum System. Physical Review Letters, 131(4), 043601-1-043601–043606. https://doi.org/10.1103/PhysRevLett.131.043601 (reposiTUm) | |
1. | Reiter, T., Klemenschits, X., Filipovic, L. (2022). Impact of Plasma Induced Damage on the Fabrication of 3D NAND Flash Memory. Solid-State Electronics, 192(108261), 108261. https://doi.org/10.1016/j.sse.2022.108261 (reposiTUm) | |
Talks and Poster Presentations (with Proceedings-Entry)
8. | Reiter, T., Filipovic, L. (2023). Fast 3D Flux Calculation Using Monte Carlo Ray Tracing on GPUs. In Proceedings of the International Conference on Microelectronic Devices and Technologies (MicDAT '2023)) (pp. 67–72), Funchal, Portugal. https://doi.org/10.13140/RG.2.2.13265.71524 (reposiTUm) | |
7. | Reiter, T., Toifl, A., Hössinger, A., Filipovic, L. (2023). Modeling Oxide Regrowth During Selective Etching in Vertical 3D NAND Structures. In 2023 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD) (pp. 85–88), Kobe, Japan. https://doi.org/10.23919/SISPAD57422.2023.10319506 (reposiTUm) | |
6. | Filipovic, L., Bobinac, J., Piso, J., Reiter, T. (2023). Physics-Informed Compact Model for SF6/O2 Plasma Etching. In 2023 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD) (pp. 73–76), Kobe, Japan. https://doi.org/10.23919/SISPAD57422.2023.10319479 (reposiTUm) | |
5. | Filipovic, L., Reiter, T., Klemenschits, X., Leroch, S., Stella, R., Baumgartner, O., Hössinger, A. (2023). Process Simulation in Micro- And Nano-Electronics. In Book of abstracts of the International Workshop on Computational Nanotechnology 2023 (pp. 38–39), Barcelona, Spain. (reposiTUm) | |
4. | Filipovic, L., Baumgartner, O., Piso, J., Bobinac, J., Reiter, T., Strof, G., Rzepa, G., Stanojevic, Z., Karner, M. (2022). DTCO Flow for Air Spacer Generation and Its Impact on Power and Performance at N7. In SISPAD 2022: International Conference on Simulation of Semiconductor Processes and Devices - Conference Abstract Booklet (pp. 34–35), Granada, Spain. (reposiTUm) | |
3. | Bobinac, J., Reiter, T., Piso, J., Klemenschits, X., Baumgartner, O., Stanojevic, Z., Strof, G., Karner, M., Filipovic, L. (2022). Impact of Mask Tapering on SF6/O2 Plasma Etching. In Microelectronic Devices and Technologies: Proceedings of the 4rd International Conference on Microelectronic Devices and Technologies (MicDAT '2022) (pp. 90–94), Corfu, Greece. (reposiTUm) | |
2. | Reiter, T., Klemenschits, X., Filipovic, L. (2022). Modeling Plasma-Induced Damage During the Dry Etching of Silicon. In 2022 IEEE International Integrated Reliability Workshop (IIRW) (pp. 1–5), South Lake Tahoe, CA, United States. https://doi.org/10.1109/IIRW56459.2022.10032764 (reposiTUm) | |
1. | Reiter, T., Klemenschits, X., Filipovic, L. (2021). Impact of High-Aspect-Ratio Etching Damage on Selective Epitaxial Silicon Growth in 3D NAND Flash Memory. In 2021 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS'2021), Caen, France. https://doi.org/10.1109/eurosoi-ulis53016.2021.9560693 (reposiTUm) | |
Diploma and Master Theses (authored and supervised)
2. | T. Reiter: "Stabilisierung von Spin-Ensembles in hybriden Quantensystemen"; Supervisor: S. Rotter; Institut für Theoretische Physik (136), 2022; final examination: 2022-04-29. | |
1. | Reiter, T. (2022). Stabilization of Spin Ensembles in Hybrid Quantum Systems Technische Universität Wien. https://doi.org/10.34726/hss.2022.96371 (reposiTUm) | |