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Publications Martin Rottinger

10 records


Talks and Poster Presentations (with Proceedings-Entry)


5. M. Rottinger, N. Seifert, S. Selberherr:
"Analysis of AVC Measurements";
Talk: European Solid-State Device Research Conference (ESSDERC), Bordeaux; 1998-09-07 - 1998-09-09; in "Proceedings of the European Solid-State Device Research Conference (ESSDERC)", (1998), ISBN: 2-86332-234-6, 344 - 347. BibTeX

4. M. Rottinger, N. Seifert, S. Selberherr:
"Simulation of AVC Measurements";
Talk: International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), Leuven, Belgium; 1998-09-02 - 1998-09-04; in "Proceedings of the International Conference on Simulation of Semiconductor Processes and Devices (SISPAD)", (1998), ISBN: 3-211-83208-4, 284 - 287 doi:10.1007/978-3-7091-6827-1_72. BibTeX

3. T. Simlinger, M. Rottinger, S. Selberherr:
"A Method for Unified Treatment of Interface Conditions Suitable for Device Simulation";
Talk: International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), Cambridge, MA, USA; 1997-09-08 - 1997-09-10; in "Proceedings of the International Conference on Simulation of Semiconductor Processes and Devices (SISPAD)", (1997), ISBN: 0-7803-3775-1, 173 - 176 doi:10.1109/SISPAD.1997.621365. BibTeX

2. T. Simlinger, H. Kosina, M. Rottinger, S. Selberherr:
"MINIMOS-NT: A Generic Simulator for Complex Semiconductor Devices";
Talk: European Solid-State Device Research Conference (ESSDERC), Den Haag; 1995-09-25 - 1995-09-27; in "Proceedings of the European Solid-State Device Research Conference (ESSDERC)", (1995), ISBN: 2-86332-182-x, 83 - 86. BibTeX

1. M. Rottinger, T. Simlinger, S. Selberherr:
"Two-Dimensional Transient Simulation of Charge-Coupled Devices Using MINIMOS-NT";
Talk: International Conference on the Simulation of Semiconductor Devices and Processes (SISDEP), Erlangen; 1995-09-06 - 1995-09-08; in "Proceedings SISDEP 95 Conference", (1995), ISBN: 3-211-82736-6, 440 - 443 doi:10.1007/978-3-7091-6619-2_106. BibTeX


Talks and Poster Presentations (without Proceedings-Entry)


1. V. Palankovski, M. Rottinger, T. Simlinger, S. Selberherr:
"Two-Dimensional Simulation and Comparison of Si-based and GaAs-based HBTs";
Talk: III-V Semiconductor Device Simulation Workshop, Turin; 1997-10-16 - 1997-10-17; . BibTeX


Doctor's Theses (authored and supervised)


1. M. Rottinger:
"Selected Simulations of Semiconductor Structures";
Reviewer: S. Selberherr, E. Gornik; Institut für Mikroelektronik, 1999, oral examination: 1999-06-25. BibTeX


Scientific Reports


3. T. Grasser, A. Hössinger, H. Kirchauer, M. Knaipp, R. Martins, R. Plasun, M. Rottinger, G. Schrom, S. Selberherr:
"VISTA Status Report December 1997";
(1997), 36 page(s) . BibTeX

2. M. Knaipp, H. Kosina, R. Mlekus, M. Radi, M. Rottinger, S. Selberherr:
"VISTA Status Report June 1997";
(1997), 31 page(s) . BibTeX

1. M. Knaipp, C. Pichler, G. Rieger, M. Rottinger, R. Sabelka, S. Selberherr, R. Strasser:
"VISTA Status Report December 1995";
(1995), 21 page(s) . BibTeX

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Institute for Microelectronics
Head: Univ. Prof. Dipl.-Ing. Dr. techn. Tibor Grasser
Deputy Head: O. Univ. Prof. Dipl.-Ing. Dr. techn. Dr.h.c. Siegfried Selberherr
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