Publications Martin Rottinger
10 records
| 5. | M. Rottinger, N. Seifert, S. Selberherr: "Analysis of AVC Measurements"; Talk: European Solid-State Device Research Conference (ESSDERC), Bordeaux; 1998-09-07 - 1998-09-09; in "Proceedings of the European Solid-State Device Research Conference (ESSDERC)", (1998), ISBN: 2-86332-234-6, 344 - 347. BibTeX |
| 4. | M. Rottinger, N. Seifert, S. Selberherr: "Simulation of AVC Measurements"; Talk: International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), Leuven, Belgium; 1998-09-02 - 1998-09-04; in "Proceedings of the International Conference on Simulation of Semiconductor Processes and Devices (SISPAD)", (1998), ISBN: 3-211-83208-4, 284 - 287 doi:10.1007/978-3-7091-6827-1_72. BibTeX |
| 3. | T. Simlinger, M. Rottinger, S. Selberherr: "A Method for Unified Treatment of Interface Conditions Suitable for Device Simulation"; Talk: International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), Cambridge, MA, USA; 1997-09-08 - 1997-09-10; in "Proceedings of the International Conference on Simulation of Semiconductor Processes and Devices (SISPAD)", (1997), ISBN: 0-7803-3775-1, 173 - 176 doi:10.1109/SISPAD.1997.621365. BibTeX |
| 2. | T. Simlinger, H. Kosina, M. Rottinger, S. Selberherr: "MINIMOS-NT: A Generic Simulator for Complex Semiconductor Devices"; Talk: European Solid-State Device Research Conference (ESSDERC), Den Haag; 1995-09-25 - 1995-09-27; in "Proceedings of the European Solid-State Device Research Conference (ESSDERC)", (1995), ISBN: 2-86332-182-x, 83 - 86. BibTeX |
| 1. | M. Rottinger, T. Simlinger, S. Selberherr: "Two-Dimensional Transient Simulation of Charge-Coupled Devices Using MINIMOS-NT"; Talk: International Conference on the Simulation of Semiconductor Devices and Processes (SISDEP), Erlangen; 1995-09-06 - 1995-09-08; in "Proceedings SISDEP 95 Conference", (1995), ISBN: 3-211-82736-6, 440 - 443 doi:10.1007/978-3-7091-6619-2_106. BibTeX |
| 1. | V. Palankovski, M. Rottinger, T. Simlinger, S. Selberherr: "Two-Dimensional Simulation and Comparison of Si-based and GaAs-based HBTs"; Talk: III-V Semiconductor Device Simulation Workshop, Turin; 1997-10-16 - 1997-10-17; . BibTeX |
| 1. | M. Rottinger: "Selected Simulations of Semiconductor Structures"; Reviewer: S. Selberherr, E. Gornik; Institut für Mikroelektronik, 1999, oral examination: 1999-06-25. BibTeX |
| 3. | T. Grasser, A. Hössinger, H. Kirchauer, M. Knaipp, R. Martins, R. Plasun, M. Rottinger, G. Schrom, S. Selberherr: "VISTA Status Report II"; (1997), 36 page(s) . BibTeX |
| 2. | M. Knaipp, H. Kosina, R. Mlekus, M. Radi, M. Rottinger, S. Selberherr: "VISTA Status Report I"; (1997), 31 page(s) . BibTeX |
| 1. | M. Knaipp, C. Pichler, G. Rieger, M. Rottinger, R. Sabelka, S. Selberherr, R. Strasser: "VISTA Status Report II"; (1995), 21 page(s) . BibTeX |