Publications Martin Rottinger

10 records

Talks and Poster Presentations (with Proceedings-Entry)

5.  M. Rottinger, N. Seifert, S. Selberherr:
"Analysis of AVC Measurements";
Talk: European Solid-State Device Research Conference (ESSDERC), Bordeaux; 1998-09-07 - 1998-09-09; in: "Proceedings of the European Solid-State Device Research Conference (ESSDERC)", (1998), ISBN: 2-86332-234-6; 344 - 347.

4.  M. Rottinger, N. Seifert, S. Selberherr:
"Simulation of AVC Measurements";
Talk: International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), Leuven, Belgium; 1998-09-02 - 1998-09-04; in: "Proceedings of the International Conference on Simulation of Semiconductor Processes and Devices (SISPAD)", (1998), ISBN: 3-211-83208-4; 284 - 287. https://doi.org/10.1007/978-3-7091-6827-1_72

3.  T. Simlinger, M. Rottinger, S. Selberherr:
"A Method for Unified Treatment of Interface Conditions Suitable for Device Simulation";
Talk: International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), Cambridge, MA, USA; 1997-09-08 - 1997-09-10; in: "Proceedings of the International Conference on Simulation of Semiconductor Processes and Devices (SISPAD)", (1997), ISBN: 0-7803-3775-1; 173 - 176. https://doi.org/10.1109/SISPAD.1997.621365

2.  T. Simlinger, H. Kosina, M. Rottinger, S. Selberherr:
"MINIMOS-NT: A Generic Simulator for Complex Semiconductor Devices";
Talk: European Solid-State Device Research Conference (ESSDERC), Den Haag; 1995-09-25 - 1995-09-27; in: "Proceedings of the European Solid-State Device Research Conference (ESSDERC)", (1995), ISBN: 2-86332-182-x; 83 - 86.

1.  M. Rottinger, T. Simlinger, S. Selberherr:
"Two-Dimensional Transient Simulation of Charge-Coupled Devices Using MINIMOS-NT";
Talk: International Conference on the Simulation of Semiconductor Devices and Processes (SISDEP), Erlangen; 1995-09-06 - 1995-09-08; in: "Proceedings SISDEP 95 Conference", (1995), ISBN: 3-211-82736-6; 440 - 443. https://doi.org/10.1007/978-3-7091-6619-2_106

Doctor's Theses (authored and supervised)

1.  M. Rottinger:
"Selected Simulations of Semiconductor Structures";
Supervisor, Reviewer: S. Selberherr, E. Gornik; Institut für Mikroelektronik, 1999; oral examination: 1999-06-25.

Diploma and Master Theses (authored and supervised)

1.  V. Palankovski, M. Rottinger, T. Simlinger, S. Selberherr:
"Two-Dimensional Simulation and Comparison of Si-based and GaAs-based HBTs";
Talk: III-V Semiconductor Device Simulation Workshop, Turin; 1997-10-16 - 1997-10-17.

Scientific Reports

3.  T. Grasser, A. Hössinger, H. Kirchauer, M. Knaipp, R. Martins, R. Plasun, M. Rottinger, G. Schrom, S. Selberherr:
"VISTA Status Report December 1997";
1997; 36 pages.

2.  M. Knaipp, H. Kosina, R. Mlekus, M. Radi, M. Rottinger, S. Selberherr:
"VISTA Status Report June 1997";
1997; 31 pages.

1.  M. Knaipp, C. Pichler, G. Rieger, M. Rottinger, R. Sabelka, S. Selberherr, R. Strasser:
"VISTA Status Report December 1995";
1995; 21 pages.