| 7.
|
A. Shah, M. Waltl:
"Impact of Negative Bias Temperature Instability on Single Event Transients in Scaled Logic Circuits";
International Journal Of Numerical Modelling-Electronic Networks Devices And Fields,
34,
(2021),
e2854-1 - e2854-13
doi:10.1002/jnm.2854.
BibTeX
|
| 6.
|
S. Khan, A. Shah, S. Chouhan, N. Gupta, J. Pandey, S. Vishvakarma:
"A Symmetric D Flip-Flop Based PUF with Improved Uniqueness";
Microelectronics Reliability,
106,
(2020),
113595
doi:10.1016/j.microrel.2020.113595.
BibTeX
|
| 5.
|
G. Raut, A. Shah, V. Sharma, G. Rajput, S. Vishvakarma:
"A 2.4-GS/s Power-Efficient, High-Resolution Reconfigurable Dynamic Comparator for ADC Architecture";
Circuits Systems and Signal Processing,
39,
(2020),
4681 - 4694
doi:10.1007/s00034-020-01371-4.
BibTeX
|
| 4.
|
A. Shah, D. Rossi, V. Sharma, S. Vishvakarma, M. Waltl:
"Soft Error Hardening Enhancement Analysis of NBTI Tolerant Schmitt Trigger Circuit";
Microelectronics Reliability,
107,
(2020),
113617
doi:10.1016/j.microrel.2020.113617.
BibTeX
|
| 3.
|
A. Shah, M. Waltl:
"Bias Temperature Instability Aware and Soft Error Tolerant Radiation Hardened 10T SRAM";
Electronics,
9,
(2020),
256-1 - 256-12
doi:10.3390/electronics9020256.
BibTeX
|
| 2.
|
S. Khan, A. Shah, N. Gupta, S. Chouhan, J. Pandey, S. Vishvakarma:
"An Ultra-Low Power, Reconfigurable, Aging Resilient RO PUF for IoT Applications";
Microelectronics Journal,
92,
(2019),
104605
doi:10.1016/j.mejo.2019.104605.
BibTeX
|
| 1.
|
P. Sanvale, N. Gupta, V. Neema, A. Shah, S. Vishvakarma:
"An Improved Read-Assist Energy Efficient Single Ended P-P-N Based 10T SRAM Cell for Wireless Sensor Networ";
Microelectronics Journal,
92,
(2019),
104611
doi:10.1016/j.mejo.2019.104611.
BibTeX
|
