Publications Bianka Ullmann
13 records
| 2. | B. Ullmann, G. Artner, I. Hahn, P. Hans, H. Krebs, P. Eder-Neuhauser, R. Zemann: "Proceedings VSS 2016 - Vienna young Scientists Symposium"; Book of Abstracts, Dipl.Ing. Heinz A. Krebs, 2352 Gumpoldskirchen, (2016), ISBN: 978-3-9504017-2-1, 128 page(s) . BibTeX |
| 1. | R. Zemann, A. Grill, I. Hahn, H. Krebs, A. Mayr, P. Eder-Neuhauser, B. Ullmann: "Proceedings VSS 2015 - Vienna young Scientists Symposium"; Book of Abstracts, Dipl.Ing. Heinz A. Krebs, 2352 Gumpoldskirchen, (2015), ISBN: 978-3-9504017-07, 182 page(s) . BibTeX |
| 4. | M. Jech, B. Ullmann, G. Rzepa, S. E. Tyaginov, A. Grill, M. Waltl, D. Jabs, C. Jungemann, T. Grasser: "Impact of Mixed Negative Bias Temperature Instability and Hot Carrier Stress on MOSFET Characteristics-Part II: Theory"; IEEE Transactions on Electron Devices, 66, (2019), 241 - 248 doi:10.1109/TED.2018.2873421. BibTeX |
| 3. | B. Ullmann, M. Jech, K. Puschkarsky, G.A. Rott, M. Waltl, Yu. Illarionov, H. Reisinger, T. Grasser: "Impact of Mixed Negative Bias Temperature Instability and Hot Carrier Stress on MOSFET Characteristics-Part I: Experimental"; IEEE Transactions on Electron Devices, 66, (2019), 232 - 240 doi:10.1109/TED.2018.2873419. BibTeX |
| 2. | B. Ullmann, K. Puschkarsky, M. Waltl, H. Reisinger, T. Grasser: "Evaluation of Advanced MOSFET Threshold Voltage Drift Measurement Techniques"; IEEE Transactions on Device and Materials Reliability, 19, (2019), 358 - 362 doi:10.1109/TDMR.2019.2909993. BibTeX |
| 1. | B. Ullmann, T. Grasser: "Transformation: Nanotechnology - Challenges in Transistor Design and Future Technologies"; E&I Elektrotechnik und Informationstechnik, 134, (2017), 349 - 354 doi:10.1007/s00502-017-0534-y. BibTeX |
| 2. | B. Ullmann, M. Jech, S. E. Tyaginov, M. Waltl, Yu. Illarionov, A. Grill, K. Puschkarsky, H. Reisinger, T. Grasser: "The Impact of Mixed Negative Bias Temperature Instability and Hot Carrier Stress on Single Oxide Defects"; Poster: International Reliability Physics Symposium (IRPS), Monterey, CA, USA; 2017-04-04 - 2017-04-06; in "Proceedings of the International Reliability Physics Symposium (IRPS)", (2017), ISBN: 978-1-5090-6642-1, XT-10.1 - XT-10.6 doi:10.1109/IRPS.2017.7936424. BibTeX |
| 1. | B. Ullmann, M. Waltl, T. Grasser: "Characterization of the Permanent Component of MOSFET Degradation Mechanisms"; Talk: Vienna Young Scientists Symposium - VSS 2015, Vienna University of Technology; 2015-06-25 - 2015-06-26; in "Proceedings of the 2015 Vienna Young Scient Symposium", (2015), ISBN: 978-3-9504017-0-7, 36 - 37. BibTeX |
| 4. | T. Windbacher, B. Ullmann, A. Grill, J. Weinbub: "Ihr Smartphone - ein Supercomputer vor 20 Jahren. Ein Einblick in die Mikro- und Nanoelektronik"; Talk: European Researchers' Night: beSCIENCEd 2016, Wien; 2016-09-30. BibTeX |
| 3. | B. Ullmann, A. Grill, P. Manstetten, M. Jech, M. Kampl, W. H. Zisser, L. Filipovic, M. Thesberg, F. Rudolf, T. Windbacher, J. Cervenka, M. Katterbauer, J. Weinbub: "Ihr Smartphone - ein Supercomputer vor 20 Jahren. Ein Einblick in die Mikro- und Nanoelektronik"; Talk: Lange Nacht der Forschung 2016, Wien; 2016-04-22. BibTeX |
| 2. | G. Winkler, M. Schreitl, B. Ullmann, W. Schlichtner, G. Steinhauser, G. Kazakov, Thorsten Schumm: "Towards a nuclear clock with 229Thorium"; Poster: CoQus summer school 2013, Vienna, Austria; 2013-09-02 - 2013-09-06; . BibTeX |
| 1. | M. Schreitl, G. Winkler, B. Ullmann, W. Schlichtner, G. Steinhauser, G. Kazakov, Thorsten Schumm: "Towards a nuclear clock with 229Thorium"; Poster: QCMC 2012, Vienna, Austria; 2012-07-30 - 2012-08-03; . BibTeX |
| 1. | B. Ullmann: "Mixed Negative Bias Temperature Instability and Hot-Carrier Stress"; Reviewer: T. Grasser, J. Schmitz, S. Reggiani; Institut für Mikroelektronik, 2018, oral examination: 2018-06-28. BibTeX |