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Publications Wilfried Wessner

20 records


Publications in Scientific Journals


3. G. Karlowatz, W. Wessner, H. Kosina:
"Effect of Band Structure Discretization on the Performance of Full-Band Monte Carlo Simulation";
Mathematics and Computers in Simulation, 79, (2008), 972 - 979 doi:10.1016/j.matcom.2008.02.021. BibTeX

2. J. Cervenka, W. Wessner, E. Al-Ani, T. Grasser, S. Selberherr:
"Generation of Unstructured Meshes for Process and Device Simulation by Means of Partial Differential Equations";
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, 25, (2006), 2118 - 2128 doi:10.1109/TCAD.2006.876514. BibTeX

1. W. Wessner, J. Cervenka, C. Heitzinger, A. Hössinger, S. Selberherr:
"Anisotropic Mesh Refinement for the Simulation of Three-Dimensional Semiconductor Manufacturing Processes";
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, 25, (2006), 2129 - 2139 doi:10.1109/TCAD.2005.862750. BibTeX


Contributions to Books


1. G. Karlowatz, E. Ungersböck, W. Wessner, H. Kosina, S. Selberherr:
"Analysis of Hole Transport in Arbitrarily Strained Germanium";
in "SiGe and Ge: Materials, Processing, and Devices, Vol. 3, No. 7", issued by The Electrochemical Society; D. Harame, J. Boquet, M. Caymax, J. Cressler, H. Iwai, S. Koester, G. Masini, J. Murota, A. Reznicek, K. Rim, B. Tillack, S. Zaima (ed); ECS Transactions, 2006, ISBN: 1-56677-507-8, 443 - 450 doi:10.1149/1.2355842. BibTeX


Talks and Poster Presentations (with Proceedings-Entry)


11. G. Karlowatz, E. Ungersböck, W. Wessner, H. Kosina, S. Selberherr:
"Analysis of Hole Transport in Arbitrarily Strained Germanium";
Talk: Meeting of the Electrochemical Society, SiGe and Germanium: Materials, Processing, and Devices, Cancun; 2006-10-29 - 2006-11-03; in "210th ECS Meeting", (2006), ISSN: 1091-8213, 1 page(s) . BibTeX

10. G. Karlowatz, E. Ungersböck, W. Wessner, H. Kosina:
"Full-Band Monte Carlo Analysis of Electron Transport in Arbitrary Strained Silicon";
Talk: International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), Monterey, CA, USA; 2006-09-06 - 2006-09-08; in "Proceedings of the International Conference on Simulation of Semiconductor Processes and Devices (SISPAD)", (2006), ISBN: 1-4244-0404-5, 63 - 66 doi:10.1109/SISPAD.2006.282839. BibTeX

9. G. Karlowatz, W. Wessner, H. Kosina:
"Effect of Band Structure Discretization on the Performance of Full-Band Monte Carlo Simulation";
Talk: International Symposium on Mathematical Modeling (MATHMOD), Wien; 2006-02-08 - 2006-02-10; in "5th Mathmod Vienna Proceedings", (2006), ISBN: 3-901608-30-3, 4-1 - 4-6. BibTeX

8. A. Nentchev, R. Sabelka, W. Wessner, S. Selberherr:
"On-Chip Interconnect Simulation of Parasitic Capacitances in Periodic Structures";
Talk: European Simulation and Modeling Conference (ESMC), Porto; 2005-10-24 - 2005-10-26; in "The 2005 European Simulation and Modelling Conference Proceedings", (2005), 420 - 424. BibTeX

7. W. Wessner, H. Ceric, J. Cervenka, S. Selberherr:
"Dynamic Mesh Adaptation for Three-Dimensional Electromigration Simulation";
Talk: International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), Tokyo, Japan; 2005-09-01 - 2005-09-03; in "Proceedings of the International Conference on Simulation of Semiconductor Processes and Devices (SISPAD)", (2005), ISBN: 4-9902762-0-5, 147 - 150 doi:10.1109/SISPAD.2005.201494. BibTeX

6. W. Wessner, S. Wagner, T. Grasser, S. Selberherr:
"Meshing Aspects on Three-Dimensional Fin-Fet Device Simulations";
Talk: Asia Pacific Microwave Conference (APMC), New Delhi; 2004-12-15 - 2004-12-18; in "Asia Pacific Microwave Conference 2004, Abstracts and Proceedings (CDROM)", (2004), ISBN: 81-7764-722-9, 4 page(s) . BibTeX

5. H. Ceric, R. Sabelka, S. Holzer, W. Wessner, S. Wagner, T. Grasser, S. Selberherr:
"The Evolution of the Resistance and Current Density During Electromigration";
Poster: International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), Munich, Germany; 2004-09-02 - 2004-09-04; in "Proceedings of the International Conference on Simulation of Semiconductor Processes and Devices (SISPAD)", (2004), ISBN: 3211224688, 331 - 334 doi:10.1007/978-3-7091-0624-2_78. BibTeX

4. W. Wessner, Ch. Hollauer, A. Hössinger, S. Selberherr:
"Anisotropic Laplace Refinement for Three-Dimensional Oxidation Simulation";
Talk: International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), Munich, Germany; 2004-09-02 - 2004-09-04; in "Proceedings of the International Conference on Simulation of Semiconductor Processes and Devices (SISPAD)", (2004), ISBN: 3211224688, 165 - 168 doi:10.1007/978-3-7091-0624-2_39. BibTeX

3. W. Wessner, H. Ceric, C. Heitzinger, A. Hössinger, S. Selberherr:
"Anisotropic Mesh Adaption Governed by a Hessian Matrix Metric";
Talk: European Simulation Symposium (ESS), Delft; 2003-10-26 - 2003-10-29; in "Simulation in Industry, 15th European Simulation Symposium", (2003), ISBN: 3-936150-28-1, 41 - 46. BibTeX

2. W. Wessner, A. Hössinger, S. Selberherr:
"Anisotropic Mesh Refinement for Three-Dimensional Diffusion Simulation";
Poster: Informationstagung Mikroelektronik (ME), Wien; 2003-10-01 - 2003-10-02; in "Beiträge der Informationstagung Mikroelektronik 2003", (2003), ISBN: 3-85133-030-7, 523 - 528. BibTeX

1. W. Wessner, C. Heitzinger, A. Hössinger, S. Selberherr:
"Error Estimated Driven Anisotropic Mesh Refinement for Three-Dimensional Diffusion Simulation";
Talk: International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), Cambridge, MA, USA; 2003-09-03 - 2003-09-05; in "Proceedings of the International Conference on Simulation of Semiconductor Processes and Devices (SISPAD)", (2003), ISBN: 0-7803-7826-1, 109 - 112 doi:10.1109/SISPAD.2003.1233649. BibTeX


Talks and Poster Presentations (without Proceedings-Entry)


1. W. Wessner, H. Ceric, Ch. Hollauer, E. Langer, S. Selberherr:
"Electromigration Reliability TCAD Solutions";
Talk: SEMICON Europa2005, München; (invited) 2005-04-12 - 2005-04-14; . BibTeX


Doctor's Theses (authored and supervised)


1. W. Wessner:
"Mesh Refinement Techniques for TCAD Tools";
Reviewer: S. Selberherr, W. Purgathofer; Institut für Mikroelektronik, 2007, oral examination: 2007-01-09 doi:10.34726/hss.2006.7320. BibTeX


Diploma and Master Theses (authored and supervised)


1. W. Wessner:
"Jump and Walk - Ein Punkt-Lokalisierungs-Algorithmus für Komplexe Dreidimensionale Tetraeder-Gitter-Strukturen";
Supervisor: E. Langer, T. Binder; Institut für Mikroelektronik, 2002, . BibTeX


Scientific Reports


2. A. Gehring, M. Pourfath, E. Ungersböck, S. Wagner, W. Wessner, S. Selberherr:
"VISTA Status Report December 2004";
(2004), 32 page(s) . BibTeX

1. A. Gehring, C. Heitzinger, A. Hössinger, E. Ungersböck, W. Wessner, S. Selberherr:
"VISTA Status Report December 2003";
(2003), 29 page(s) . BibTeX

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Institute for Microelectronics
Head: Univ. Prof. Dipl.-Ing. Dr. techn. Tibor Grasser
Deputy Head: O. Univ. Prof. Dipl.-Ing. Dr. techn. Dr.h.c. Siegfried Selberherr
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