Publications Christoph Wilhelmer
13 recordsPublications in Scientific Journals
| 3. | Wilhelmer, C., Waldhör, D., Cvitkovich, L., Milardovich, D., Waltl, M., Grasser, T. (2023). Over- And Undercoordinated Atoms as a Source of Electron and Hole Traps in Amorphous Silicon Nitride (A-Si3N4). Nanomaterials, 13(16), Article 2286. https://doi.org/10.3390/nano13162286 (reposiTUm) | |
| 2. | Wilhelmer, C., Waldhoer, D., Jech, M., El-Sayed, A.-M. B., Cvitkovich, L., Waltl, M., Grasser, T. (2022). Ab Initio Investigations in Amorphous Silicon Dioxide: Proposing a Multi-State Defect Model for Electron and Hole Capture. Microelectronics Reliability, 139(114801), 114801. https://doi.org/10.1016/j.microrel.2022.114801 (reposiTUm) | |
| 1. | Obhod̵aš, J., Valković, V., Vinković, A., Sudac, D., Čanad̵ija, I., Pensa, T., Fiket, Ž., Turyanskaya, A., Bretschneider, T., Wilhelmer, C., Gunchin, G., Kregsamer, P., Wobrauschek, P., Streli, C. (2021). X-Ray Fluorescence Techniques for Element Abundance Analysis in Wine. ACS Omega, 6(35), 22643–22654. https://doi.org/10.1021/acsomega.1c02731 (reposiTUm) | |
Talks and Poster Presentations (with Proceedings-Entry)
| 6. | Wilhelmer, C., Waldhör, D., Cvitkovich, L., Waltl, M., Grasser, T. (2023). Ab Initio Investigations of Electron and Hole Trapping Processes of H Induced Defects in Amorphous SiO₂. In The 14th International Conference on SiO₂, Dielectrics and Related Devices : Book of Abstracts (pp. 18–19), Palermo, Italy. (reposiTUm) | |
| 5. | Wilhelmer, C., Waldhör, D., Milardovich, D., Cvitkovich, L., Waltl, M., Grasser, T. (2023). Intrinsic Electron Trapping in Amorphous Silicon Nitride (A-Si3N4:H). In 2023 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD) (pp. 149–152), Kobe, Japan. https://doi.org/10.23919/SISPAD57422.2023.10319493 (reposiTUm) | |
| 4. | Cvitkovich, L., Waldhör, D., El-Sayed, A., Jech, M., Wilhelmer, C., Grasser, T. (2022). Ab-Initio Modeling of the Initial Stages of Si(100) Thermal Oxidation. In PSI-K 2022: abstracts book (p. 209), Lausanne, Schwitzerland. (reposiTUm) | |
| 3. | Wilhelmer, C., Waldhör, D., Jech, M., El-Sayed, A., Cvitkovich, L., Waltl, M., Grasser, T. (2022). Ab-Initio Study of Multi-State Defects in Amorphous SiO2. In PSI-K 2022: abstracts book (p. 264), Lausanne, Schwitzerland. (reposiTUm) | |
| 2. | Cvitkovich, L., Jech, M., Waldhör, D., El-Sayed, A., Wilhelmer, C., Grasser, T. (2021). Multiscale Modeling Study of Native Oxide Growth on a Si(100) Surface. In ESSDERC 2021 - IEEE 51st European Solid-State Device Research Conference (ESSDERC), Montreux, Austria. https://doi.org/10.1109/essderc53440.2021.9631790 (reposiTUm) | |
| 1. | Wilhelmer, C., Jech, M., Waldhoer, D., El-Sayed, A., Cvitkovich, L., Grasser, T. (2021). Statistical Ab Initio Analysis of Electron Trapping Oxide Defects in the Si/SiO2 Network. In ESSDERC 2021 - IEEE 51st European Solid-State Device Research Conference (ESSDERC), Montreux, Austria. https://doi.org/10.1109/essderc53440.2021.9631833 (reposiTUm) | |
Talks and Poster Presentations (without Proceedings-Entry)
| 3. | Wilhelmer, C., Milardovich, D., Waldhör, D., Cvitkovich, L., Waltl, M., Grasser, T. (2023, May 29). Charged Instrinsic Defect States in Amorphous Si3N4 European Materials Research Society (E-MRS) Spring Meeting 2023, Strasbourg, France. (reposiTUm) | |
| 2. | Wilhelmer, C., Milardovich, D., Waldhör, D., Cvitkovich, L., Waltl, M., Grasser, T. (2023, May 30). Intrinsic Charge Trapping Sites in Amorphous Si₃N₄ European Materials Research Society (E-MRS) Spring Meeting 2023, Strasbourg, France. (reposiTUm) | |
| 1. | Taupin, M., Dzsaber, S., Yan, X., Wilhelmer, C., Prokofiev, A., Paschen, S. (2019). Experimental Study of the Strongly Correlated Weyl Semimetal Ce3Bi4Pd3. NGSCES 2019, Pescara, EU. (reposiTUm) | |
Diploma and Master Theses (authored and supervised)
| 1. | Wilhelmer, C. (2019). Weyl-Kondo Semimetal Candidate Ce3Bi4Pd3 and Its Nonmagnetic Counterpart La3Bi4Pd3 Technische Universität Wien. (reposiTUm) | |