On Nov. 19th 2021 our colleague Matthias Kratzmann successfully defended his master thesis. Matthias was working on the “Development of a CV Measurement Module for Defect Spectroscopy of MOS Transistors” and has been supervised by Michael Waltl and Tibor Grasser.
Congratulations Matthias.
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Michael Waltl | Single-Defect Spectroscopy in Semiconductor Devices
Christian Doppler Laboratory at the Institue for Microelectronics