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2.1 Subthreshold Leakage
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Michael Stockinger's Dissertation
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1.3 Outline of this
2. ULSI MOS Device Phenomena
2.1 Subthreshold Leakage
2.2 Punchthrough
2.3 Drain-Induced Barrier Lowering
2.4 Hot Carrier Effects
2.5 Gate Leakage
Michael Stockinger
2000-01-05
