Our manuscript titled Electrostatic Coupling and Identification of Single-Defects in GaN/AlGaN Fin-MIS-HEMTs has been accepted by Solid-State Electronics.
Michael Waltl | Single-Defect Spectroscopy in Semiconductor Devices
Christian Doppler Laboratory at the Institue for Microelectronics
Our manuscript titled Electrostatic Coupling and Identification of Single-Defects in GaN/AlGaN Fin-MIS-HEMTs has been accepted by Solid-State Electronics.