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Our new approach combines the immediate relevance of system models
with the accuracy of device simulation at minimum computing
effort.
Yielding system information directly for arbitrary operating points,
like worst-case process corners, makes this method an ideal tool for
fast device evaluation without the need of full compact-model
characterization during the optimization process.
G. Schrom, V. De, and S. Selberherr: VLSI Performance Metric Based on Minimum TCAD Simulations