Professors
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Hydrogen-Related Volatile Defects as the Possible Cause for the Recoverable Component of NBTI and RTN | ![]() |
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Thermoelectric Properties of Semiconductor Nanostructures and Nanostructured Tunnel FETs | ![]() |
Administration
Researchers
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Quantum Evolution over Discrete Phase Space Trajectories | ![]() |
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The Influence of Processing on the Performance and Reliability of Through Silicon Vias | ![]() |
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Concept of a Bias-Field-Free Spin-Torque Oscillator Based on Two MgO-MTJs | ![]() |
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Reduction of the Surface Roughness Induced Spin Relaxation in SOI Structures: An Analytical Approach | ![]() |
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Physical Modeling of Hot-Carrier Degradation for Short- and Long-Channel MOSFETs | ![]() |
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Single-Trap Study of PBTI in SiON NMOS Transistors Using the Time-Dependent Defect Spectroscopy | ![]() |