t |
... | a time step |
x |
... | a grid point difference |
, ,
 |
... | electron, hole, and general exponents in mobility models |
 |
... | damping control parameter |
 |
... | dielectric constant |
 |
... | relative dielectric constant |
 |
... | lattice heat capacity |
,  |
... | thermal conductivity of electron and hole gas |
 |
... | mobility of carrier type  |
 |
... | mobility due to lattice scattering |
 |
... | mobility due to lattice and impurity scattering |
 |
... | mobility due to lattice, impurity, and surface
scattering |
 |
... | mobility including lattice, impurity, surface
scattering, and high-field reduction |
 |
... | mobility including lattice, impurity, surface
scattering, and high-temperature reduction |
,  |
... | electron and hole mobilities |
 |
... | lattice mass density |
 |
... | energy relaxation times for electrons, holes, and
general carrier type |
 |
... | node voltage for mixed-mode simulation |
 |
... | node voltage for mixed-mode simulation applied to
a contact |
,
 |
... | quasi-Fermi potentials for electrons
and holes |
 |
... | contact potential for mixed-mode simulation |
 |
... | electrostatic potential |
 |
... | Built-In potential |
| C |
... | net doping concentration |
|
E |
... | local electric field |
| Eb |
... | local band edge energy for electrons or holes |
| EC |
... | local band edge energy for electrons |
|
Eg |
... | bandgap energy |
|
Ei |
... | intrinsic Fermi level |
| EV |
... | local band edge energy for holes |
| Fn, Fp |
... | driving force for electrons and holes |
| Ibi, j |
... | electron or hole current between the grid points
i and j |
|
Jn,
Jp |
... | electron and hole current densities |
| NC |
... | effective density of states for electrons |
| NC, 0 |
... | effective density of states for electrons evaluated at reference temperature T0 |
|
Ni |
... | concentration of the i-th active dopand |
| NT |
... | total impurity concentration |
| NV |
... | effective density of states for holes |
| NV, 0 |
... | effective density of states for holes evaluated at reference temperature T0 |
| R |
... | net recombination rate |
|
RAU |
... | Auger recombination rate |
|
RBB |
... | band to band tunneling recombination rate |
|
RII |
... | impact ionization recombination rate |
| Ri |
... | net recombination rate of the i-th box |
|
RSRH |
... | SRH net recombination rate |
|
RT |
... | thermal resistance |
|
Sn,
Sp |
... | electron and hole heat flux density |
|
SL |
... | lattice heat flux density |
|
TC |
... | contact temperature |
| TL |
... | local lattice temperature |
| Tn, Tp |
... | electron and hole temperatures |
| VT |
... | thermal voltage for a certain lattice temperature |
| Vi |
... | the box volume of the i-th box |
| cL |
... | specific lattice heat capacity |
| d |
... | damping parameter |
|
fx |
... | vector function of the equation system |
| h |
... | Planck constant |
 |
... | reduced Planck constant |
|
kB |
... | Boltzmann constant |
| mn, p |
... | absolute electron and hole mass |
|
mn, p * |
... | effective electron and hole mass |
| n |
... | electron concentration |
| p |
... | hole concentration |
|
q |
... | elementary charge |
|
ux |
... | update vector of the equation system |
| vn, 300, vp, 300 |
... | thermal electron and hole velocities at 300 K |
|
x |
... | solution vector of the equation system |
|
x* |
... | new approach to the solution vector of the equation system |
|
yref |
... | surface reference distance |