| Symbol | Definition | Description |
|---|---|---|
|
|
Maximum electric far field density | |
| Differential mode current | ||
| Frequency | ||
| Surface area, loop area | ||
| Distance from Source point to field observation point | ||
| Parallel plane separation distance | ||
|
|
Relative dielectric constant of the material | |
| Noise current | ||
| Width of rectangular parallel planes (y-dimension) | ||
| Length of rectangular parallel planes (x-dimension) | ||
| Quality factor of a resonator | ||
| Conductivity | ||
|
|
Loss tangent | |
| Resonance frequency | ||
| Positive integer values | ||
|
|
Maximum radiated electric far field from an antenna | |
| Antenna feed point current | ||
| Antenna feed point voltage | ||
|
|
Resistances in a circuit | |
| Coupling resistance | ||
| Common mode current | ||
| Supply (battery) voltage | ||
| Measurement voltage | ||
| Coupling capacitance | ||
|
|
Self inductances of two loops | |
| Mutual inductance of two loops | ||
| Coupling inductance of two loops | ||
|
|
Stray inductances of two loops | |
| Electric field density | ||
| Magnetic field density | ||
| Electric current density | ||
| Permittivity of a material | ||
| Permeability of a material | ||
| Imaginary unit: |
||
| Integer index | ||
| Angular frequency: |
||
| x-direction component of |
||
| y-direction component of |
||
| z-direction component of |
||
|
|
lossless wave number:
|
|
| Parallel plane inductance | ||
| Capacitance per parallel plane area | ||
|
|
Plane thickness of metal plane i | |
|
|
Skin depth of metal plane i | |
| Parallel plane resistance | ||
| Parallel plane conductance | ||
| z-direction component of |
||
|
|
Boundary curve of a parallel plane structure | |
|
|
Parallel plane voltage at position
|
|
|
|
Mutual plane impedance matrix element | |
| Effective width of rectangular parallel planes | ||
| Effective length of rectangular parallel planes | ||
| Rectangular parallel plane eigenvalue of x-direction | ||
| Rectangular parallel plane eigenvalue of y-direction | ||
| Wave number | ||
| Two dimensional fourier series coefficient | ||
|
|
Position of port with index i on parallel planes | |
|
|
Position of port with index j on parallel planes | |
|
|
Parallel plane discretization for LCR grid method | |
| Approximate parallel plane voltage distribution | ||
| Residuum (Approximation error) of |
||
| Finite element weighting function | ||
|
|
Finite element base functions | |
|
|
Nodal approximation of the parallel plane voltage | |
|
|
Barycentric (triangular) coordinates of triangle i | |
| Area of the triangle with index i | ||
|
|
System matrix | |
|
|
Approximate solution vector | |
|
|
Excitation vector | |
|
|
Solution vector normal derivation | |
|
|
Boundary weighting matrix | |
| System matrix elements | ||
| Excitation vector elements | ||
|
|
Parallel plane impedance matrix | |
| Measurement port current | ||
| Trace current at the source position | ||
| Trace current at the load position | ||
|
|
Trace to cavity coupling factor | |
| Characteristic trace impedance | ||
| Trace propagation constant | ||
| Trace load impedance | ||
| Effective trace length | ||
| Horizontal trace length | ||
| Trace distance from the ground plane | ||
| Capacitance of trace and cover | ||
| Capacitance of cover and ground plane | ||
| Capacitance of trace and ground plane | ||
|
|
Coupling factor from mode decomposition | |
| Electrostatic potential | ||
|
|
Analytical coupling factor | |
|
|
Plane voltage of model with a trace | |
| Trace width | ||
|
|
Permittivity of vacuum | |
| Field scan height above the ground plane | ||
|
|
Complex scanned current density | |
|
|
Components of complex, scanned current density | |
| Coupling factor in scan height | ||
|
|
Coupling constants | |
| Median coupling factor of an IC interconnect path | ||
| Distance to ground of IC interconnect segment i | ||
| Length of interconnect segment i | ||
| Common mode voltage | ||
| Common mode inductance of a trace above ground | ||
| Common mode inductance of a trace between two planes | ||
| Differential voltage at opposite plane ports | ||
| Coupling inductance from a trace to parallel planes | ||
|
|
Measured common mode inductance | |
| Transfer impedance | ||
| Surface normal vector | ||
| Parallel plane excitation current | ||
| Parallel plane voltage at mode m,n | ||
|
|
Source term of parallel plane voltage | |
|
|
Observation point term of parallel plane voltage | |
|
|
Resonances of rectangular power planes | |
| Magnetic vector potential | ||
| Electric vector potential | ||
| Vector from origin to field observation point | ||
| Vector from origin to source point | ||
|
|
Vector from source to field observation point | |
| Active antenna dimension | ||
| Angle between |
||
| Magnetic current density | ||
|
|
Approximate electric far field density | |
|
|
Approximate magnetic far field density | |
|
|
Wavelength in vacuum | |
| Pointing vector | ||
|
|
Pointing vector of ports with indexes c and r | |
| Admittance matrix elements | ||
|
|
Measurement voltage vector | |
|
|
Interface port voltage vector | |
|
|
Radiation admittance matrix | |
|
|
Condition number of matrix
|
|
|
|
Minimum eigenvalue of matrix
|
|
|
|
Maximum eigenvalue of matrix
|
|
| Threshold value for matrix condition number | ||
| Emission reduction estimation for d reduction | ||
| Emission reduction estimation for shielding | ||
| Emission reduction estimation for ground under an IC |
C. Poschalko: The Simulation of Emission from Printed Circuit Boards under a Metallic Cover