As a result the model is only defined once but there exist several similar instances of itself in the simulation. Given that an investigation requires more than one instance of this simulation-flow-model, all of these models share common properties except the gate length. Therefore, if a change of the simulation-flow-model is necessary, this change has only to be done once at the definition of the simulation-flow-model. Typical TCAD investigations require up to ten snapshots of a process (including several wafer areas under various process conditions). This illustrates how useful model reuse is in conjunction with parameter overloading, and the drastic decrease of administrative efforts which are required to maintain simulation descriptions.