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Tomáš Hadámek; Nils Petter Jørstad; Wolfgang Goes; Siegfried Selberherr; Viktor Sverdlov

Study of Self-Heating and its Effects in SOT-STT-MRAM Proceedings Article

In: SISPAD 2023: International Conference on Simulation of Semiconductor Processes and Devices - Conference Abstract Booklet, pp. 337–340, 2023, ISBN: 978-4-86348-803-8, (talk: International Conference on Simulation of Semiconductor Processes and Devices (SISPAD 2023), Kobe, Japan; 2023-09-27 – 2023-09-29).

Links | BibTeX | Tags: SOT-STT-MRAM