3.2.1 Physical Model



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3.2.1 Physical Model

 

The model is based on numerical solution of the time-dependent basic semiconductor equations

 

 

 

where and are the effective (net) generation rates for electrons and holes, respectively and is the total trapped charge. Our model allows arbitrary interface and bulk trap distributions in the energy and position space. Let us consider single-level interface traps with density , located at the position along the channel and at the energy level . The trap dynamics are described by the Shockley-Read-Hall equations [409][179]:

  

where is the electron recombination rate due to capture of electrons from the conduction band into traps, the hole recombination rate due to capture of holes from the valence band (transfer of electrons from traps to the valence band), the electron generation rate due to emission of electrons from traps to the conduction band and is the hole generation rate due to emission of holes from traps (transfer of electrons from the valence band into traps). is the occupied trap density. The electron and hole capture and emission time constants are given by

 

 

, are the average thermal velocities towards the interface and , the average capture cross-sections for electrons and holes, respectively. , , and are effective density of states and band edge energy for the conduction and valence band, respectively. and are the electron and hole surface concentrations at the position . The factor , due to trap degeneracy, is assumed to be unity henceforwardgif. In the above model, known as the Shockley-Read-Hall theory, both the conduction and valence band are reduced to a single energy level with density and energy , and , , respectively, whose population is governed by Maxwell-Boltzmann statistics. Expressions 3.6 represent the definition for the capture cross-sections which are assumed to be averaged over the corresponding band ([179]). The relationships 3.7 follow from the principle of the detailed balance between both bands and traps, normally holding in equilibrium. Note that the trap occupancy function is given in equilibrium by the Fermi-Dirac statistics

 

When applying the relationships 3.4, 3.5, 3.6 and 3.7 to non-equilibrium conditions, it is postulated that the capture cross-sections associated with the emission and capture processes remain constant and equal to each other as at the equilibrium - an assumption neither confirmed nor refuted for interface traps so far. Henceforward, we also neglect a possible dispersion in values for the capture cross-sections associated with . Note that our formulation allows arbitrary dependences of the cross-sections on the energy position and on the local surface field. In deriving 3.6 and 3.7 Maxwell-Boltzmann statistics are assumed with all carriers at the lattice temperature. Both conditions are well fulfilled during the course of charge pumping.

The trap-dynamics equation is given by

 

where is the steady-state occupancy function and is an effective time constant which determines the actual trap dynamics

 

The trap-trap transitions, when more trap levels exist in the forbidden gap, are not accounted for in equation 3.9 gif. Such approach is proper for interface traps. In spite of their possible close location in the energy space, interface traps are separated in the position space. The electron wave functions are very localized at the trap site. It is believed, that the wave functions of neighbour interface traps do not overlap. For bulk traps trap-trap transitions can take place. Assuming interacting traps at the energy levels , , with densities and probabilities per unit time for the transition of an electron from level to level , the dynamics equation for the traps at becomes

 

where denotes the occupied trap density for the level . The time constants , and are the same as defined previously. Dynamics of traps at are influenced by the dynamics of all trap levels. The system of differential equations 3.11 () is of first order and linear. However, the coefficients of individual equations depend on the solution of other equations. Since we will consider the interface traps () only, all equations 3.11 are independent from each other in our calculations.



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Next: 3.2.2 Discretization of the Up: 3.2 Physical Model and Previous: 3.2 Physical Model and



Martin Stiftinger
Sat Oct 15 22:05:10 MET 1994