degradation for 
resulting
from the low-voltage stress conditions studied here (small 
), noise
seriously limits the accuracy. Nonetheless, good scalability for different
devices (
, 
, and 
) can be obtained (Fig. 6.12
(top)).
Due to the relatively low degradation for resulting
from the low-voltage stress conditions studied here (small ), noise
seriously limits the accuracy. Nonetheless, good scalability for different
devices (, , and ) can be obtained (Fig. 6.12
(top)).
for different oxide thicknesses (
, 
,
and 
) can be scaled as well. Only the thick device is affected by noise
due to the low degradation. The graph at the very bottom combines the
three dependencies.