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3.3.3 Total Electromigration Strain
The total strain induced by electromigration is given by the sum of the vacancy migration and vacancy generation/annihilation components,

(3.40) 
Taking the time derivative of (3.40), and using (3.35) and (3.39), the total strain rate produced by electromigration is given by

(3.41) 
Since
is a diagonal tensor with equal entries, one can write (3.41) in terms of the trace of the strain tensor

(3.42) 
Given the dependence of the electromigration induced strain on the source function , the modeling approach for mechanisms of generation and annihilation of vacancies becomes of crucial importance.
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Up: 3.3 Electromigration Induced Stress
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R. L. de Orio: Electromigration Modeling and Simulation