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3.1.4 Chemical Mechanical Planarization

Before stripping the first material, this is the right time for a short intermission in order to present an idealized CMP model. It works in a simplified way that any material above a specified vertical level will be removed, regardless of applied force, pressure redistribution, chemical surface interactions, dissolution velocities, pressure enhanced dissolution, mechanical properties and thickness of the pad, pattern densities, and variations in pattern heights. Just look at the marvelous result in Fig. 3.5.

Figure 3.5: Emulation of chemical mechanical planarization.
\begin{figure}\begin{center}
\psfrag{1.2 \247m}[][cb][1.7]{{1.2 \mbox{$\mu\math...
...{0.49\textwidth}{!}{\includegraphics{eps-geo/cmp.eps}}}
\end{center}\end{figure}

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W. Pyka: Feature Scale Modeling for Etching and Deposition Processes in Semiconductor Manufacturing