We’re proud to announce that our colleague, Bernhard won the Best Student Paper Award at IIRW 2019 (IEEE International Integrated Reliability Workshop) in Lake Tahoe for his paper “Statistical Characterization of BTI and RTN using pMOS Arrays”.
Congratulations Bernhard!
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Michael Waltl | Single-Defect Spectroscopy in Semiconductor Devices
Christian Doppler Laboratory at the Institue for Microelectronics